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Atomic Force Microscopy

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Atomic Force Microscopy/ by Bert Voigtländer.
作者:	Voigtländer, Bert.
面頁冊數:	XIV, 331 p. 157 illus., 129 illus. in color.online resource. :
Contained By:	Springer Nature eBook
標題:	Spectroscopy. -
電子資源:	https://doi.org/10.1007/978-3-030-13654-3
ISBN:	9783030136543

Atomic Force Microscopy
Voigtländer, Bert.

Atomic Force Microscopy[electronic resource] /by Bert Voigtländer. - 2nd ed. 2019. - XIV, 331 p. 157 illus., 129 illus. in color.online resource. - NanoScience and Technology,1434-4904. - NanoScience and Technology,.

Introduction -- Part I: Scanning Probe Microscopy Instrumentation -- Harmonic Oscillator -- Technical Aspects of Scanning Probe Microscopy -- Scanning Probe Microscopy Designs -- Electronics for Scanning Probe Microscopy -- Lock-In Technique -- Data Representation and Image Processing -- Artifacts in SPM -- Work Function, Contact Potential, and Kelvin Probe -- Part II: Atomic Force Microscopy (AFM) -- Forces between Tip and Sample -- Technical Aspects of Atomic Force Microscopy -- Static Atomic Force Microscopy -- Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy -- Intermittent Contact Mode/Tapping Mode -- Mapping of Mechanical Properties Using Force-Distance -- Frequency Modulation (FM) Mode in Dynamic Atomic Force -- Noise in Atomic Force Microscopy -- Quartz Sensors in Atomic Force Microscopy.

This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.

ISBN: 9783030136543

Standard No.: 10.1007/978-3-030-13654-3doiSubjects--Topical Terms:

1102161
Spectroscopy.

LC Class. No.: QC450-467

Dewey Class. No.: 621.36

Atomic Force Microscopy
LDR:03127nam a22004335i 4500 001 1005255
003 DE-He213
005 20200703160256.0
007 cr nn 008mamaa
008 210106s2019 gw | s |||| 0|eng d
020 $a 9783030136543 $9 978-3-030-13654-3
024 7 $a 10.1007/978-3-030-13654-3 $2 doi
035 $a 978-3-030-13654-3
050 4 $a QC450-467
050 4 $a QC718.5.S6
072 7 $a PNFS $2 bicssc
072 7 $a SCI078000 $2 bisacsh
072 7 $a PNFS $2 thema
072 7 $a PDN $2 thema
082 0 4 $a 621.36 $2 23
100 1 $a Voigtländer, Bert. $e author. $4 aut $4 http://id.loc.gov/vocabulary/relators/aut $3 1263658
245 1 0 $a Atomic Force Microscopy $h [electronic resource] / $c by Bert Voigtländer.
250 $a 2nd ed. 2019.
264 1 $a Cham : $b Springer International Publishing : $b Imprint: Springer, $c 2019.
300 $a XIV, 331 p. 157 illus., 129 illus. in color. $b online resource.
336 $a text $b txt $2 rdacontent
337 $a computer $b c $2 rdamedia
338 $a online resource $b cr $2 rdacarrier
347 $a text file $b PDF $2 rda
490 1 $a NanoScience and Technology, $x 1434-4904
505 0 $a Introduction -- Part I: Scanning Probe Microscopy Instrumentation -- Harmonic Oscillator -- Technical Aspects of Scanning Probe Microscopy -- Scanning Probe Microscopy Designs -- Electronics for Scanning Probe Microscopy -- Lock-In Technique -- Data Representation and Image Processing -- Artifacts in SPM -- Work Function, Contact Potential, and Kelvin Probe -- Part II: Atomic Force Microscopy (AFM) -- Forces between Tip and Sample -- Technical Aspects of Atomic Force Microscopy -- Static Atomic Force Microscopy -- Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy -- Intermittent Contact Mode/Tapping Mode -- Mapping of Mechanical Properties Using Force-Distance -- Frequency Modulation (FM) Mode in Dynamic Atomic Force -- Noise in Atomic Force Microscopy -- Quartz Sensors in Atomic Force Microscopy.
520 $a This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.
650 0 $a Spectroscopy. $3 1102161
650 0 $a Microscopy. $3 582141
650 0 $a Nanotechnology. $3 557660
650 0 $a Nanoscale science. $3 1253587
650 0 $a Nanoscience. $3 632473
650 0 $a Nanostructures. $3 561754
650 1 4 $a Spectroscopy and Microscopy. $3 768852
650 2 4 $a Nanotechnology and Microengineering. $3 722030
650 2 4 $a Nanoscale Science and Technology. $3 783795
650 2 4 $a Biological Microscopy. $3 668791
710 2 $a SpringerLink (Online service) $3 593884
773 0 $t Springer Nature eBook
776 0 8 $i Printed edition: $z 9783030136536
776 0 8 $i Printed edition: $z 9783030136550
776 0 8 $i Printed edition: $z 9783030136567
830 0 $a NanoScience and Technology, $x 1434-4904 $3 1254041
856 4 0 $u https://doi.org/10.1007/978-3-030-13654-3
912 $a ZDB-2-CMS
912 $a ZDB-2-SXC
950 $a Chemistry and Materials Science (SpringerNature-11644)
950 $a Chemistry and Material Science (R0) (SpringerNature-43709)