語系:
繁體中文
English
說明(常見問題)
登入
回首頁
切換:
標籤
|
MARC模式
|
ISBD
Si Detectors and Characterization fo...
~
Srivastava, Ajay Kumar.
Si Detectors and Characterization for HEP and Photon Science Experiment = How to Design Detectors by TCAD Simulation /
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
正題名/作者:
Si Detectors and Characterization for HEP and Photon Science Experiment/ by Ajay Kumar Srivastava.
其他題名:
How to Design Detectors by TCAD Simulation /
作者:
Srivastava, Ajay Kumar.
面頁冊數:
XVII, 183 p. 106 illus., 77 illus. in color.online resource. :
Contained By:
Springer Nature eBook
標題:
Particle acceleration. -
電子資源:
https://doi.org/10.1007/978-3-030-19531-1
ISBN:
9783030195311
Si Detectors and Characterization for HEP and Photon Science Experiment = How to Design Detectors by TCAD Simulation /
Srivastava, Ajay Kumar.
Si Detectors and Characterization for HEP and Photon Science Experiment
How to Design Detectors by TCAD Simulation /[electronic resource] :by Ajay Kumar Srivastava. - 1st ed. 2019. - XVII, 183 p. 106 illus., 77 illus. in color.online resource.
Development OF Si DETECTORS FOR THE CMS LHC Experiments -- Physics and Technology of Si Detectors.-Performance of MCz Si Material for p+nn+ and n+pp+ Si Sensor Design: Status and Development for HL-LHC: Status and Development for HL-LHC -- Development OF RADIATION HARD PIXEL DETECTORS FOR THE EUROPEAN XFEL -- T-CAD Simulation for the designing of detectors -- Development of Radiation Hard p+n Si Pixel Sensors for the European XFEL -- Analysis & Optimal Design of Radiation Hard p+n Si Pixel Detector for the Next generation Photon Science Experiments -- CapacitanceS in p+n silicon pixel sensors using 3-D TCAD simulation approach.-CHARACTERIZATION OF SI DETECTORS -- Analysis and TCAD Simulation for C/V, and G/V Electrical Characteristics of Gated Controlled Diodes for the AGIPD of the EuXFEL -- Si Detector for HEP and Photon Science Experiments: How to Design Detectors by TCAD Simulation -- Appendices.
This book reviews the HL-LHC experiments and the fourth-generation photon science experiments, discussing the latest radiation hardening techniques, optimization of device & process parameters using TCAD simulation tools, and the experimental characterization required to develop rad-hard Si detectors for x-ray induced surface damage and bulk damage by hadronic irradiation. Consisting of eleven chapters, it introduces various types of strip and pixel detector designs for the current upgrade, radiation, and dynamic range requirement of the experiments, and presents an overview of radiation detectors, especially Si detectors. It also describes the design of pixel detectors, experiments and characterization of Si detectors. The book is intended for researchers and master’s level students with an understanding of radiation detector physics. It provides a concept that uses TCAD simulation to optimize the electrical performance of the devices used in the harsh radiation environment of the colliders and at XFEL. .
ISBN: 9783030195311
Standard No.: 10.1007/978-3-030-19531-1doiSubjects--Topical Terms:
681844
Particle acceleration.
LC Class. No.: QC770-798
Dewey Class. No.: 539.73
Si Detectors and Characterization for HEP and Photon Science Experiment = How to Design Detectors by TCAD Simulation /
LDR
:03359nam a22003975i 4500
001
1006217
003
DE-He213
005
20200703194325.0
007
cr nn 008mamaa
008
210106s2019 gw | s |||| 0|eng d
020
$a
9783030195311
$9
978-3-030-19531-1
024
7
$a
10.1007/978-3-030-19531-1
$2
doi
035
$a
978-3-030-19531-1
050
4
$a
QC770-798
072
7
$a
PHP
$2
bicssc
072
7
$a
SCI051000
$2
bisacsh
072
7
$a
PHP
$2
thema
082
0 4
$a
539.73
$2
23
100
1
$a
Srivastava, Ajay Kumar.
$e
author.
$4
aut
$4
http://id.loc.gov/vocabulary/relators/aut
$3
1299717
245
1 0
$a
Si Detectors and Characterization for HEP and Photon Science Experiment
$h
[electronic resource] :
$b
How to Design Detectors by TCAD Simulation /
$c
by Ajay Kumar Srivastava.
250
$a
1st ed. 2019.
264
1
$a
Cham :
$b
Springer International Publishing :
$b
Imprint: Springer,
$c
2019.
300
$a
XVII, 183 p. 106 illus., 77 illus. in color.
$b
online resource.
336
$a
text
$b
txt
$2
rdacontent
337
$a
computer
$b
c
$2
rdamedia
338
$a
online resource
$b
cr
$2
rdacarrier
347
$a
text file
$b
PDF
$2
rda
505
0
$a
Development OF Si DETECTORS FOR THE CMS LHC Experiments -- Physics and Technology of Si Detectors.-Performance of MCz Si Material for p+nn+ and n+pp+ Si Sensor Design: Status and Development for HL-LHC: Status and Development for HL-LHC -- Development OF RADIATION HARD PIXEL DETECTORS FOR THE EUROPEAN XFEL -- T-CAD Simulation for the designing of detectors -- Development of Radiation Hard p+n Si Pixel Sensors for the European XFEL -- Analysis & Optimal Design of Radiation Hard p+n Si Pixel Detector for the Next generation Photon Science Experiments -- CapacitanceS in p+n silicon pixel sensors using 3-D TCAD simulation approach.-CHARACTERIZATION OF SI DETECTORS -- Analysis and TCAD Simulation for C/V, and G/V Electrical Characteristics of Gated Controlled Diodes for the AGIPD of the EuXFEL -- Si Detector for HEP and Photon Science Experiments: How to Design Detectors by TCAD Simulation -- Appendices.
520
$a
This book reviews the HL-LHC experiments and the fourth-generation photon science experiments, discussing the latest radiation hardening techniques, optimization of device & process parameters using TCAD simulation tools, and the experimental characterization required to develop rad-hard Si detectors for x-ray induced surface damage and bulk damage by hadronic irradiation. Consisting of eleven chapters, it introduces various types of strip and pixel detector designs for the current upgrade, radiation, and dynamic range requirement of the experiments, and presents an overview of radiation detectors, especially Si detectors. It also describes the design of pixel detectors, experiments and characterization of Si detectors. The book is intended for researchers and master’s level students with an understanding of radiation detector physics. It provides a concept that uses TCAD simulation to optimize the electrical performance of the devices used in the harsh radiation environment of the colliders and at XFEL. .
650
0
$a
Particle acceleration.
$3
681844
650
0
$a
Computer-aided engineering.
$3
560192
650
0
$a
Physical measurements.
$3
902742
650
0
$a
Measurement .
$3
1253766
650
0
$a
Solid state physics.
$3
641431
650
0
$a
Materials science.
$3
557839
650
0
$a
Nuclear physics.
$3
591618
650
0
$a
Heavy ions.
$3
786798
650
1 4
$a
Particle Acceleration and Detection, Beam Physics.
$3
671851
650
2 4
$a
Computer-Aided Engineering (CAD, CAE) and Design.
$3
669928
650
2 4
$a
Measurement Science and Instrumentation.
$3
769080
650
2 4
$a
Solid State Physics.
$3
768851
650
2 4
$a
Characterization and Evaluation of Materials.
$3
674449
650
2 4
$a
Nuclear Physics, Heavy Ions, Hadrons.
$3
672685
710
2
$a
SpringerLink (Online service)
$3
593884
773
0
$t
Springer Nature eBook
776
0 8
$i
Printed edition:
$z
9783030195304
776
0 8
$i
Printed edition:
$z
9783030195328
776
0 8
$i
Printed edition:
$z
9783030195335
856
4 0
$u
https://doi.org/10.1007/978-3-030-19531-1
912
$a
ZDB-2-PHA
912
$a
ZDB-2-SXP
950
$a
Physics and Astronomy (SpringerNature-11651)
950
$a
Physics and Astronomy (R0) (SpringerNature-43715)
筆 0 讀者評論
多媒體
評論
新增評論
分享你的心得
Export
取書館別
處理中
...
變更密碼[密碼必須為2種組合(英文和數字)及長度為10碼以上]
登入