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Springer Handbook of Microscopy

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Springer Handbook of Microscopy/ edited by Peter W. Hawkes, John C.H. Spence.
other author:	Hawkes, Peter W.
Description:	XXXII, 1543 p. 1140 illus. in color.online resource. :
Contained By:	Springer Nature eBook
Subject:	Materials science. -
Online resource:	https://doi.org/10.1007/978-3-030-00069-1
ISBN:	9783030000691

Springer Handbook of Microscopy
Springer Handbook of Microscopy[electronic resource] /edited by Peter W. Hawkes, John C.H. Spence. - 1st ed. 2019. - XXXII, 1543 p. 1140 illus. in color.online resource. - Springer Handbooks,2522-8692. - Springer Handbooks,.

Part A: Electron and Ion Microscopy -- Kirkland et al.: Atomic Resolution Transmission Electron Microscopy -- Nellist: Scanning Transmission Electron Microscopy -- Ross & Minor: In situ Transmission Electron Microscopy -- Plitzko & Baumeister: Crytoelectron TEM -- Erdmann et al: Scanning Electron Microscopy -- Thiel: Variable Pressure Scanning Electron Microscopy -- Botton, Pradhudev: Analytical Electron Microscopy -- Campbell et al: High-Speed Electron Microscopy -- Bauer: LEEM, SPLEEM and SPELEEM -- Feng & Scholl: Photoemission Electron Microscopy -- Tromp: Spectroscopy with the Low Energy Electron Microscope -- Van Aert: Model-Based Electron Microscopy -- Hawkes & Krivanek: Aberration Correctors, Monochromators, Spectrometer -- Hlawacek: Ion Microscopy.-Kelly: Atom-Probe Tomography -- Part B: Holography, Ptychography and Diffraction -- Dunin-Borkowski et al.: Electron Holography.-Rodenburg & Maiden: Ptychography -- Zuo: Electron Nanodiffraction -- Musumeci & Li: High-Energy Time-Resolved Electron Diffraction -- Spence: Diffractive Imaging of Single Particles -- Part C: Photon-based Microscopy -- Diaspro et al: Fluorescence Microscopy -- Sahl et al.: Far-Field Fluorescence Microscopy -- Jacobson et al: Zone-Plate X-Ray Microscopy -- Lin et al: Microcomputed Tomography -- Part D: Applied Microscopy -- Huey et al: Scanning Probe Microscopy in Materials Science -- Leary & Midgeley: Electron Tomography in Materials Science -- Sutter: Scanning Tunneling Microscopy in Surface Science -- Hamidian et al: Visualizing electronic quantum matter -- Ma et al (Terasaki): Microscopy of Nanoporous Crystals -- Wen: Biomedical X-Ray Phase-Contrast Imaging and Tomography -- Amrein & Stamov: Atomic Force Microscopy in the Life Sciences -- Jones: Microscopy in Forensic Sciences.

This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology. Separate chapters are devoted to confocal, fluorescent and related novel optical microscopies, coherent diffractive imaging, scanning probe microscopy, transmission electron microscopy in all its modes from aberration corrected and analytical to in-situ and time-resolved, low energy electron microscopy, photoelectron microscopy, cryo-electron microscopy in biology, and also ion microscopy. In addition to serving as an essential reference for researchers and teachers in the fields such as materials science, condensed matter physics, solid-state chemistry, structural biology and the molecular sciences generally, the Springer Handbook of Microscopy is a unified, coherent and pedagogically attractive text for advanced students who need an authoritative yet accessible guide to the science and practice of microscopy.

ISBN: 9783030000691

Standard No.: 10.1007/978-3-030-00069-1doiSubjects--Topical Terms:

557839
Materials science.

LC Class. No.: TA404.6

Dewey Class. No.: 620.11

Springer Handbook of Microscopy
LDR:04594nam a22003975i 4500 001 1009750
003 DE-He213
005 20200706163109.0
007 cr nn 008mamaa
008 210106s2019 gw | s |||| 0|eng d
020 $a 9783030000691 $9 978-3-030-00069-1
024 7 $a 10.1007/978-3-030-00069-1 $2 doi
035 $a 978-3-030-00069-1
050 4 $a TA404.6
072 7 $a TGMT $2 bicssc
072 7 $a TEC021000 $2 bisacsh
072 7 $a TGMT $2 thema
082 0 4 $a 620.11 $2 23
245 1 0 $a Springer Handbook of Microscopy $h [electronic resource] / $c edited by Peter W. Hawkes, John C.H. Spence.
250 $a 1st ed. 2019.
264 1 $a Cham : $b Springer International Publishing : $b Imprint: Springer, $c 2019.
300 $a XXXII, 1543 p. 1140 illus. in color. $b online resource.
336 $a text $b txt $2 rdacontent
337 $a computer $b c $2 rdamedia
338 $a online resource $b cr $2 rdacarrier
347 $a text file $b PDF $2 rda
490 1 $a Springer Handbooks, $x 2522-8692
505 0 $a Part A: Electron and Ion Microscopy -- Kirkland et al.: Atomic Resolution Transmission Electron Microscopy -- Nellist: Scanning Transmission Electron Microscopy -- Ross & Minor: In situ Transmission Electron Microscopy -- Plitzko & Baumeister: Crytoelectron TEM -- Erdmann et al: Scanning Electron Microscopy -- Thiel: Variable Pressure Scanning Electron Microscopy -- Botton, Pradhudev: Analytical Electron Microscopy -- Campbell et al: High-Speed Electron Microscopy -- Bauer: LEEM, SPLEEM and SPELEEM -- Feng & Scholl: Photoemission Electron Microscopy -- Tromp: Spectroscopy with the Low Energy Electron Microscope -- Van Aert: Model-Based Electron Microscopy -- Hawkes & Krivanek: Aberration Correctors, Monochromators, Spectrometer -- Hlawacek: Ion Microscopy.-Kelly: Atom-Probe Tomography -- Part B: Holography, Ptychography and Diffraction -- Dunin-Borkowski et al.: Electron Holography.-Rodenburg & Maiden: Ptychography -- Zuo: Electron Nanodiffraction -- Musumeci & Li: High-Energy Time-Resolved Electron Diffraction -- Spence: Diffractive Imaging of Single Particles -- Part C: Photon-based Microscopy -- Diaspro et al: Fluorescence Microscopy -- Sahl et al.: Far-Field Fluorescence Microscopy -- Jacobson et al: Zone-Plate X-Ray Microscopy -- Lin et al: Microcomputed Tomography -- Part D: Applied Microscopy -- Huey et al: Scanning Probe Microscopy in Materials Science -- Leary & Midgeley: Electron Tomography in Materials Science -- Sutter: Scanning Tunneling Microscopy in Surface Science -- Hamidian et al: Visualizing electronic quantum matter -- Ma et al (Terasaki): Microscopy of Nanoporous Crystals -- Wen: Biomedical X-Ray Phase-Contrast Imaging and Tomography -- Amrein & Stamov: Atomic Force Microscopy in the Life Sciences -- Jones: Microscopy in Forensic Sciences.
520 $a This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology. Separate chapters are devoted to confocal, fluorescent and related novel optical microscopies, coherent diffractive imaging, scanning probe microscopy, transmission electron microscopy in all its modes from aberration corrected and analytical to in-situ and time-resolved, low energy electron microscopy, photoelectron microscopy, cryo-electron microscopy in biology, and also ion microscopy. In addition to serving as an essential reference for researchers and teachers in the fields such as materials science, condensed matter physics, solid-state chemistry, structural biology and the molecular sciences generally, the Springer Handbook of Microscopy is a unified, coherent and pedagogically attractive text for advanced students who need an authoritative yet accessible guide to the science and practice of microscopy.
650 0 $a Materials science. $3 557839
650 0 $a Spectroscopy. $3 1102161
650 0 $a Microscopy. $3 582141
650 1 4 $a Characterization and Evaluation of Materials. $3 674449
650 2 4 $a Spectroscopy and Microscopy. $3 768852
650 2 4 $a Biological Microscopy. $3 668791
650 2 4 $a Spectroscopy/Spectrometry. $3 782573
700 1 $a Hawkes, Peter W. $4 edt $4 http://id.loc.gov/vocabulary/relators/edt $3 874065
700 1 $a Spence, John C.H. $4 edt $4 http://id.loc.gov/vocabulary/relators/edt $3 1247829
710 2 $a SpringerLink (Online service) $3 593884
773 0 $t Springer Nature eBook
776 0 8 $i Printed edition: $z 9783030000684
776 0 8 $i Printed edition: $z 9783030000707
830 0 $a Springer Handbooks, $x 2522-8692 $3 1257515
856 4 0 $u https://doi.org/10.1007/978-3-030-00069-1
912 $a ZDB-2-CMS
912 $a ZDB-2-SXC
950 $a Chemistry and Materials Science (SpringerNature-11644)
950 $a Chemistry and Material Science (R0) (SpringerNature-43709)