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Statistical Quality Technologies = Theory and Practice /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Statistical Quality Technologies/ edited by Yuhlong Lio, Hon Keung Tony Ng, Tzong-Ru Tsai, Ding-Geng Chen.
其他題名:	Theory and Practice /
其他作者:	Lio, Yuhlong.
面頁冊數:	XIX, 402 p. 59 illus., 34 illus. in color.online resource. :
Contained By:	Springer Nature eBook
標題:	Statistics . -
電子資源:	https://doi.org/10.1007/978-3-030-20709-0
ISBN:	9783030207090

Statistical Quality Technologies = Theory and Practice /
Statistical Quality TechnologiesTheory and Practice /[electronic resource] :edited by Yuhlong Lio, Hon Keung Tony Ng, Tzong-Ru Tsai, Ding-Geng Chen. - 1st ed. 2019. - XIX, 402 p. 59 illus., 34 illus. in color.online resource. - ICSA Book Series in Statistics,2199-0980. - ICSA Book Series in Statistics,.

Part I. Statistical Process Control -- Chapter 1. Some Recent Studies in Statistical Process Control -- Chapter 2. Statistical Quality Control And Reliability Analysis Using the Birnbaum-Saunders Distribution with Industrial Applications -- Chapter 3. Statistical System Monitoring (SSM) for Enterprise-Level Quality Control -- Chapter 4. Enhanced Cumulative Sum Charts based on Ranked Set Sampling -- Chapter 5. A Survey of Control Charts for Simple Linear Profile Processes with Authcorrelation -- Chapter 6. Sequential Monitoring of Circular processes related to the von Mises Distribution -- Part II. Acceptance Sampling Plans -- Chapter 7. Time Truncated Life Test Using the Generalized Multiple Dependent State Sampling plans for Various Life Distributions -- Chapter 8. Decision Theoretic Sampling Plan for One-parameter Exponential Distribution under Type-I and Type-I Hybrid Censoring Schemes -- Chapter 9. Economical Sampling Plans with Warranty -- Chapter 10. Design of Reliability Acceptance Sampling Plans under Partially Accelerated Life Test -- Part III. Reliability Testing and Designs. Chapter 11. Bayesian Sequential Design Based on Dual Objectives for Accelerated Life Tests -- Chapter 12. The Stress-strength Models for the Proportional Hazards Family and Proportional Reverse Hazards Family -- Chapter 13. A Degradation Based on the Wiener Process Assuming non-normal Distributed Measurement Errors -- Chapter 14. An Introduction of Generalized Linear Model Approach to Accelerated Life Test Planning with Type-I Censoring -- Chapter 15. Robust Design in the Case of Data Contamination and Model Departure -- Chapter 16. Defects Driven Yield and Reliability Modeling for Semiconductor Manufacturing.

This book explores different statistical quality technologies including recent advances and applications. Statistical process control, acceptance sample plans and reliability assessment are some of the essential statistical techniques in quality technologies to ensure high quality products and to reduce consumer and producer risks. Numerous statistical techniques and methodologies for quality control and improvement have been developed in recent years to help resolve current product quality issues in today’s fast changing environment. Featuring contributions from top experts in the field, this book covers three major topics: statistical process control, acceptance sampling plans, and reliability testing and designs. The topics covered in the book are timely and have a high potential impact and influence to academics, scholars, students and professionals in statistics, engineering, manufacturing and health.

ISBN: 9783030207090

Standard No.: 10.1007/978-3-030-20709-0doiSubjects--Topical Terms:

1253516
Statistics .

LC Class. No.: QA276-280

Dewey Class. No.: 519.5

Statistical Quality Technologies = Theory and Practice /
LDR:04117nam a22004095i 4500 001 1010979
003 DE-He213
005 20200702035248.0
007 cr nn 008mamaa
008 210106s2019 gw | s |||| 0|eng d
020 $a 9783030207090 $9 978-3-030-20709-0
024 7 $a 10.1007/978-3-030-20709-0 $2 doi
035 $a 978-3-030-20709-0
050 4 $a QA276-280
072 7 $a PBT $2 bicssc
072 7 $a MAT029000 $2 bisacsh
072 7 $a PBT $2 thema
082 0 4 $a 519.5 $2 23
245 1 0 $a Statistical Quality Technologies $h [electronic resource] : $b Theory and Practice / $c edited by Yuhlong Lio, Hon Keung Tony Ng, Tzong-Ru Tsai, Ding-Geng Chen.
250 $a 1st ed. 2019.
264 1 $a Cham : $b Springer International Publishing : $b Imprint: Springer, $c 2019.
300 $a XIX, 402 p. 59 illus., 34 illus. in color. $b online resource.
336 $a text $b txt $2 rdacontent
337 $a computer $b c $2 rdamedia
338 $a online resource $b cr $2 rdacarrier
347 $a text file $b PDF $2 rda
490 1 $a ICSA Book Series in Statistics, $x 2199-0980
505 0 $a Part I. Statistical Process Control -- Chapter 1. Some Recent Studies in Statistical Process Control -- Chapter 2. Statistical Quality Control And Reliability Analysis Using the Birnbaum-Saunders Distribution with Industrial Applications -- Chapter 3. Statistical System Monitoring (SSM) for Enterprise-Level Quality Control -- Chapter 4. Enhanced Cumulative Sum Charts based on Ranked Set Sampling -- Chapter 5. A Survey of Control Charts for Simple Linear Profile Processes with Authcorrelation -- Chapter 6. Sequential Monitoring of Circular processes related to the von Mises Distribution -- Part II. Acceptance Sampling Plans -- Chapter 7. Time Truncated Life Test Using the Generalized Multiple Dependent State Sampling plans for Various Life Distributions -- Chapter 8. Decision Theoretic Sampling Plan for One-parameter Exponential Distribution under Type-I and Type-I Hybrid Censoring Schemes -- Chapter 9. Economical Sampling Plans with Warranty -- Chapter 10. Design of Reliability Acceptance Sampling Plans under Partially Accelerated Life Test -- Part III. Reliability Testing and Designs. Chapter 11. Bayesian Sequential Design Based on Dual Objectives for Accelerated Life Tests -- Chapter 12. The Stress-strength Models for the Proportional Hazards Family and Proportional Reverse Hazards Family -- Chapter 13. A Degradation Based on the Wiener Process Assuming non-normal Distributed Measurement Errors -- Chapter 14. An Introduction of Generalized Linear Model Approach to Accelerated Life Test Planning with Type-I Censoring -- Chapter 15. Robust Design in the Case of Data Contamination and Model Departure -- Chapter 16. Defects Driven Yield and Reliability Modeling for Semiconductor Manufacturing.
520 $a This book explores different statistical quality technologies including recent advances and applications. Statistical process control, acceptance sample plans and reliability assessment are some of the essential statistical techniques in quality technologies to ensure high quality products and to reduce consumer and producer risks. Numerous statistical techniques and methodologies for quality control and improvement have been developed in recent years to help resolve current product quality issues in today’s fast changing environment. Featuring contributions from top experts in the field, this book covers three major topics: statistical process control, acceptance sampling plans, and reliability testing and designs. The topics covered in the book are timely and have a high potential impact and influence to academics, scholars, students and professionals in statistics, engineering, manufacturing and health.
650 0 $a Statistics . $3 1253516
650 1 4 $a Statistics for Engineering, Physics, Computer Science, Chemistry and Earth Sciences. $3 782247
650 2 4 $a Statistics for Life Sciences, Medicine, Health Sciences. $3 670172
650 2 4 $a Statistics for Business, Management, Economics, Finance, Insurance. $3 1211158
700 1 $a Lio, Yuhlong. $e editor. $4 edt $4 http://id.loc.gov/vocabulary/relators/edt $3 1305095
700 1 $a Ng, Hon Keung Tony. $4 edt $4 http://id.loc.gov/vocabulary/relators/edt $3 1070514
700 1 $a Tsai, Tzong-Ru. $e editor. $4 edt $4 http://id.loc.gov/vocabulary/relators/edt $3 1305096
700 1 $a Chen, Ding-Geng. $4 edt $4 http://id.loc.gov/vocabulary/relators/edt $3 848229
710 2 $a SpringerLink (Online service) $3 593884
773 0 $t Springer Nature eBook
776 0 8 $i Printed edition: $z 9783030207083
776 0 8 $i Printed edition: $z 9783030207106
776 0 8 $i Printed edition: $z 9783030207113
830 0 $a ICSA Book Series in Statistics, $x 2199-0980 $3 1255207
856 4 0 $u https://doi.org/10.1007/978-3-030-20709-0
912 $a ZDB-2-SMA
912 $a ZDB-2-SXMS
950 $a Mathematics and Statistics (SpringerNature-11649)
950 $a Mathematics and Statistics (R0) (SpringerNature-43713)