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VLSI Design and Test = 23rd Internat...
~
Dasgupta, Sudeb.
VLSI Design and Test = 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers /
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
正題名/作者:
VLSI Design and Test/ edited by Anirban Sengupta, Sudeb Dasgupta, Virendra Singh, Rohit Sharma, Santosh Kumar Vishvakarma.
其他題名:
23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers /
其他作者:
Sengupta, Anirban.
面頁冊數:
XVI, 775 p. 545 illus., 336 illus. in color.online resource. :
Contained By:
Springer Nature eBook
標題:
Computer hardware. -
電子資源:
https://doi.org/10.1007/978-981-32-9767-8
ISBN:
9789813297678
VLSI Design and Test = 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers /
VLSI Design and Test
23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers /[electronic resource] :edited by Anirban Sengupta, Sudeb Dasgupta, Virendra Singh, Rohit Sharma, Santosh Kumar Vishvakarma. - 1st ed. 2019. - XVI, 775 p. 545 illus., 336 illus. in color.online resource. - Communications in Computer and Information Science,10661865-0929 ;. - Communications in Computer and Information Science,498.
Analog and Mixed Signal Design -- Computing Architecture and Security -- Hardware Design and Optimization -- Low Power VLSI and Memory Design. -Device Modelling -- Hardware Implementation.
This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.
ISBN: 9789813297678
Standard No.: 10.1007/978-981-32-9767-8doiSubjects--Topical Terms:
1069242
Computer hardware.
LC Class. No.: QA75.5-76.95
Dewey Class. No.: 004
VLSI Design and Test = 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers /
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