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On-Chip Current Sensors for Reliable, Secure, and Low-Power Integrated Circuits

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	On-Chip Current Sensors for Reliable, Secure, and Low-Power Integrated Circuits/ by Rodrigo Possamai Bastos, Frank Sill Torres.
作者:	Bastos, Rodrigo Possamai.
其他作者:	Torres, Frank Sill.
面頁冊數:	XXXII, 162 p. 80 illus., 50 illus. in color.online resource. :
Contained By:	Springer Nature eBook
標題:	Electronic circuits. -
電子資源:	https://doi.org/10.1007/978-3-030-29353-6
ISBN:	9783030293536

On-Chip Current Sensors for Reliable, Secure, and Low-Power Integrated Circuits
Bastos, Rodrigo Possamai.

On-Chip Current Sensors for Reliable, Secure, and Low-Power Integrated Circuits[electronic resource] /by Rodrigo Possamai Bastos, Frank Sill Torres. - 1st ed. 2020. - XXXII, 162 p. 80 illus., 50 illus. in color.online resource.

Chapter 1. Effects of transient faults in integrated circuits -- Chapter 2. Effectiveness of hardware-level techniques in detecting transient faults -- Chapter 3. Architectures of body built-in current sensors for detection of transient faults -- Chapter 4. Enhancing the design of body built-in sensor architectures -- Chapter 5. Noise robustness of body built-in sensors -- Chapter 6. Body built-in cells for detecting transient faults and adaptively biasing subcircuits -- Chapter 7. Automatic integration of body built-in sensors into digital design flows -- Chapter 8. Body built-in sensors for testing integrated circuit systems for hardware Trojans.

This book provides readers with insight into an alternative approach for enhancing the reliability, security, and low power features of integrated circuit designs, related to transient faults, hardware Trojans, and power consumption. The authors explain how the addition of integrated sensors enables the detection of ionizing particles and how this information can be processed at a high layer. The discussion also includes a variety of applications, such as the detection of hardware Trojans and fault attacks, and how sensors can operate to provide different body bias levels and reduce power costs. Readers can benefit from these sensors-based approaches through designs with fast response time, non-intrusive integration on gate-level and reasonable design costs. Presents a unique approach for detection of radiation-induced transient faults in integrated circuits; Describes the effects of ionizing particles in the transistor body and discusses its exploitation; Includes innovative presentation of the multiple roles of body built-in sensors for reliability, security, and low-power applications.

ISBN: 9783030293536

Standard No.: 10.1007/978-3-030-29353-6doiSubjects--Topical Terms:

563332
Electronic circuits.

LC Class. No.: TK7888.4

Dewey Class. No.: 621.3815

On-Chip Current Sensors for Reliable, Secure, and Low-Power Integrated Circuits
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