國立虎尾科技大學 |

Ageing of Integrated Circuits = Causes, Effects and Mitigation Techniques /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Ageing of Integrated Circuits/ edited by Basel Halak.
其他題名:	Causes, Effects and Mitigation Techniques /
其他作者:	Halak, Basel.
面頁冊數:	XIII, 228 p. 145 illus., 107 illus. in color.online resource. :
Contained By:	Springer Nature eBook
標題:	Electronics and Microelectronics, Instrumentation. -
電子資源:	https://doi.org/10.1007/978-3-030-23781-3
ISBN:	9783030237813

Ageing of Integrated Circuits = Causes, Effects and Mitigation Techniques /
Ageing of Integrated CircuitsCauses, Effects and Mitigation Techniques /[electronic resource] :edited by Basel Halak. - 1st ed. 2020. - XIII, 228 p. 145 illus., 107 illus. in color.online resource.

Chapter 1. Understanding Ageing Mechanisms -- Chapter 2. The Effects of Ageing on the reliability and performance of Integrated Circuits -- Chapter 3. Ageing Mitigation Techniques for Microprocessors using using Anti- Ageing Software -- Chapter 4. Ageing Mitigation Techniques for SRAM Memories -- Chapter 5. Ageing-aware Logic Synthesis -- Chapter 6. On-Chip Ageing Monitoring and System Adaptation -- Chapter 7. Aging Monitors for SRAM Memory Cells and Sense Amplifiers -- Chapter 8. A Cost-Efficient Aging Sensor based on Multiple Paths Delay Fault Monitoring.

This book provides comprehensive coverage of the latest research into integrated circuits’ ageing, explaining the causes of this phenomenon, describing its effects on electronic systems, and providing mitigation techniques to build ageing-resilient circuits. Describes in detail the physical mechanisms of CMOS ageing; Provides an in-depth discussion on the impact of ageing on the performance and reliability of integrated circuits; Presents state-of-the art synthesis algorithms for ageing resilient digital systems; Introduces application-dependent techniques to mitigate the effects of aging; Discusses the design and implementation of on-chip aging monitoring sensors for aging-adaptable systems; Includes more than 200 references on state-of-art research in this area, providing direction for further reading.

ISBN: 9783030237813

Standard No.: 10.1007/978-3-030-23781-3doiSubjects--Topical Terms:

670219
Electronics and Microelectronics, Instrumentation.

LC Class. No.: TK7888.4

Dewey Class. No.: 621.3815

Ageing of Integrated Circuits = Causes, Effects and Mitigation Techniques /
LDR:02742nam a22003975i 4500 001 1023662
003 DE-He213
005 20200704174634.0
007 cr nn 008mamaa
008 210318s2020 gw | s |||| 0|eng d
020 $a 9783030237813 $9 978-3-030-23781-3
024 7 $a 10.1007/978-3-030-23781-3 $2 doi
035 $a 978-3-030-23781-3
050 4 $a TK7888.4
072 7 $a TJFC $2 bicssc
072 7 $a TEC008010 $2 bisacsh
072 7 $a TJFC $2 thema
082 0 4 $a 621.3815 $2 23
245 1 0 $a Ageing of Integrated Circuits $h [electronic resource] : $b Causes, Effects and Mitigation Techniques / $c edited by Basel Halak.
250 $a 1st ed. 2020.
264 1 $a Cham : $b Springer International Publishing : $b Imprint: Springer, $c 2020.
300 $a XIII, 228 p. 145 illus., 107 illus. in color. $b online resource.
336 $a text $b txt $2 rdacontent
337 $a computer $b c $2 rdamedia
338 $a online resource $b cr $2 rdacarrier
347 $a text file $b PDF $2 rda
505 0 $a Chapter 1. Understanding Ageing Mechanisms -- Chapter 2. The Effects of Ageing on the reliability and performance of Integrated Circuits -- Chapter 3. Ageing Mitigation Techniques for Microprocessors using using Anti- Ageing Software -- Chapter 4. Ageing Mitigation Techniques for SRAM Memories -- Chapter 5. Ageing-aware Logic Synthesis -- Chapter 6. On-Chip Ageing Monitoring and System Adaptation -- Chapter 7. Aging Monitors for SRAM Memory Cells and Sense Amplifiers -- Chapter 8. A Cost-Efficient Aging Sensor based on Multiple Paths Delay Fault Monitoring.
520 $a This book provides comprehensive coverage of the latest research into integrated circuits’ ageing, explaining the causes of this phenomenon, describing its effects on electronic systems, and providing mitigation techniques to build ageing-resilient circuits. Describes in detail the physical mechanisms of CMOS ageing; Provides an in-depth discussion on the impact of ageing on the performance and reliability of integrated circuits; Presents state-of-the art synthesis algorithms for ageing resilient digital systems; Introduces application-dependent techniques to mitigate the effects of aging; Discusses the design and implementation of on-chip aging monitoring sensors for aging-adaptable systems; Includes more than 200 references on state-of-art research in this area, providing direction for further reading.
650 2 4 $a Electronics and Microelectronics, Instrumentation. $3 670219
650 2 4 $a Processor Architectures. $3 669787
650 1 4 $a Circuits and Systems. $3 670901
650 0 $a Microelectronics. $3 554956
650 0 $a Electronics. $3 596389
650 0 $a Microprocessors. $3 632481
650 0 $a Electronic circuits. $3 563332
700 1 $a Halak, Basel. $4 edt $4 http://id.loc.gov/vocabulary/relators/edt $3 1203733
710 2 $a SpringerLink (Online service) $3 593884
773 0 $t Springer Nature eBook
776 0 8 $i Printed edition: $z 9783030237806
776 0 8 $i Printed edition: $z 9783030237820
776 0 8 $i Printed edition: $z 9783030237837
856 4 0 $u https://doi.org/10.1007/978-3-030-23781-3
912 $a ZDB-2-ENG
912 $a ZDB-2-SXE
950 $a Engineering (SpringerNature-11647)
950 $a Engineering (R0) (SpringerNature-43712)