國立虎尾科技大學 |

Circadian Rhythms for Future Resilient Electronic Systems = Accelerated Active Self-Healing for Integrated Circuits /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Circadian Rhythms for Future Resilient Electronic Systems/ by Xinfei Guo, Mircea R. Stan.
其他題名:	Accelerated Active Self-Healing for Integrated Circuits /
作者:	Guo, Xinfei.
其他作者:	Stan, Mircea R.
面頁冊數:	XIX, 208 p. 136 illus., 134 illus. in color.online resource. :
Contained By:	Springer Nature eBook
標題:	Processor Architectures. -
電子資源:	https://doi.org/10.1007/978-3-030-20051-0
ISBN:	9783030200510

Circadian Rhythms for Future Resilient Electronic Systems = Accelerated Active Self-Healing for Integrated Circuits /
Guo, Xinfei.

Circadian Rhythms for Future Resilient Electronic SystemsAccelerated Active Self-Healing for Integrated Circuits /[electronic resource] :by Xinfei Guo, Mircea R. Stan. - 1st ed. 2020. - XIX, 208 p. 136 illus., 134 illus. in color.online resource.

Introduction to Wearout -- Accelerated Self-Healing Techniques for BTI Wearout -- Accelerating and Activating Recovery for EM Wearout -- Circuit Techniques for Accelerated and Active Recovery -- Accelerated Self-Healing as a Key Design Knob for Cross-Layer Resilience -- Design and Aging Challenges in FinFET Circuits and Internet of Things (IoT) Applications -- Future Directions in Self-Healing.

This book describes methods to address wearout/aging degradations in electronic chips and systems, caused by several physical mechanisms at the device level. The authors introduce a novel technique called accelerated active self-healing, which fixes wearout issues by enabling accelerated recovery. Coverage includes recovery theory, experimental results, implementations and applications, across multiple nodes ranging from planar, FD-SOI to FinFET, based on both foundry provided models and predictive models. Presents novel techniques, tested with experiments on real hardware; Discusses circuit and system level wearout recovery implementations, many of these designs are portable and friendly to the standard design flow; Provides circuit-architecture-system infrastructures that enable the accelerated self-healing for future resilient systems; Discusses wearout issues at both transistor and interconnect level, providing solutions that apply to both; Includes coverage of resilient aspects of emerging applications such as IoT.

ISBN: 9783030200510

Standard No.: 10.1007/978-3-030-20051-0doiSubjects--Topical Terms:

669787
Processor Architectures.

LC Class. No.: TK7888.4

Dewey Class. No.: 621.3815

Circadian Rhythms for Future Resilient Electronic Systems = Accelerated Active Self-Healing for Integrated Circuits /
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