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Proceedings of 2018 International Co...
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Dong, Xinyong.
Proceedings of 2018 International Conference on Optoelectronics and Measurement
Record Type:
Language materials, printed : Monograph/item
Title/Author:
Proceedings of 2018 International Conference on Optoelectronics and Measurement/ edited by Yingquan Peng, Xinyong Dong.
other author:
Peng, Yingquan.
Description:
IX, 309 p. 203 illus., 171 illus. in color.online resource. :
Contained By:
Springer Nature eBook
Subject:
Microwaves. -
Online resource:
https://doi.org/10.1007/978-981-13-8595-7
ISBN:
9789811385957
Proceedings of 2018 International Conference on Optoelectronics and Measurement
Proceedings of 2018 International Conference on Optoelectronics and Measurement
[electronic resource] /edited by Yingquan Peng, Xinyong Dong. - 1st ed. 2020. - IX, 309 p. 203 illus., 171 illus. in color.online resource. - Lecture Notes in Electrical Engineering,5671876-1100 ;. - Lecture Notes in Electrical Engineering,317.
Fiber optics and photonics -- Light-emitting devices -- Photo detectors and solar cells -- Gas and physical sensors -- Measurement technology.
This book gathers selected papers from the first International Conference on Optoelectronics and Measurement (ICOM 2018), held in Hangzhou, China on Oct 18-20, 2018. The proceedings focus on the latest developments in the fields of optics, photonics, optoelectronics, sensors, and related measurement technologies. Addressing hot topics in fibre optics, photo detectors and sensors, it also features illustrations of advanced device technologies, explains measurement principles, and shares cutting-edge scientific and technological findings. Accordingly, readers will gain essential insights into the forefront of these fields, and will find not only important technical data, but also new ideas to inspire their own future research.
ISBN: 9789811385957
Standard No.: 10.1007/978-981-13-8595-7doiSubjects--Topical Terms:
636639
Microwaves.
LC Class. No.: TK7876-7876.42
Dewey Class. No.: 621.3
Proceedings of 2018 International Conference on Optoelectronics and Measurement
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