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Thermal Conductivity Measurements in Atomically Thin Materials and Devices

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Thermal Conductivity Measurements in Atomically Thin Materials and Devices/ by T. Serkan Kasirga.
作者:	Kasirga, T. Serkan.
面頁冊數:	XV, 50 p. 24 illus., 21 illus. in color.online resource. :
Contained By:	Springer Nature eBook
標題:	Surfaces and Interfaces, Thin Films. -
電子資源:	https://doi.org/10.1007/978-981-15-5348-6
ISBN:	9789811553486

Thermal Conductivity Measurements in Atomically Thin Materials and Devices
Kasirga, T. Serkan.

Thermal Conductivity Measurements in Atomically Thin Materials and Devices[electronic resource] /by T. Serkan Kasirga. - 1st ed. 2020. - XV, 50 p. 24 illus., 21 illus. in color.online resource. - Nanoscience and Nanotechnology,2196-1670. - Nanoscience and Nanotechnology,.

Introduction -- Importance of thermal management in modern applications -- Thermal properties of atomically thin materials and devices -- Thermal conductivity measurement methods for nanosheets -- Steady-state measurement methods -- Transient measurement methods -- Use of photothermal effects as a novel thermal conductivity measurement method -- Outlook.

This book assesses the thermal feasibility of using materials with atomically thin layers such as graphene and the transition metal dichalcogenides family in electronics and optoelectronics applications. The focus is on thermal conductivity measurement techniques currently available for the investigation of thermal performance at the material and device level. In addition to providing detailed information on the available techniques, the book introduces readers to novel techniques based on photothermal effects. .

ISBN: 9789811553486

Standard No.: 10.1007/978-981-15-5348-6doiSubjects--Topical Terms:

671207
Surfaces and Interfaces, Thin Films.

LC Class. No.: QC176.8.N35

Dewey Class. No.: 620.5

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