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Characterization, testing, measureme...

Prakash, Chander.

Characterization, testing, measurement, and metrology /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Characterization, testing, measurement, and metrology // edited by Chander Prakash, Sunpreet Singh, and J. Paulo Davim.
其他作者:	Davim, J. Paulo.
出版者:	Boca Raton :CRC Press, : c2021.,
面頁冊數:	xii, 192 p. :ill. ; : 25 cm.;
附註:	"Functional materials and advanced manufacturing"--Cover.
標題:	Materials - Testing. -
ISBN:	9780367275150 :

Characterization, testing, measurement, and metrology /
Characterization, testing, measurement, and metrology /edited by Chander Prakash, Sunpreet Singh, and J. Paulo Davim. - 1st ed. - Boca Raton :CRC Press,c2021. - xii, 192 p. :ill. ;25 cm. - Manufacturing design and technology series.

"Functional materials and advanced manufacturing"--Cover.

Includes bibliographical references and index.

"This book presents the broad aspects of measurement, performance analysis, and characterization for materials and devices by advanced manufacturing processes. The field of measurement and metrology as a pre-condition for maintaining high quality products/devices/systems in materials and advanced manufacturing process applications has grown strongly over the past years. The focus of this book is to present in numerous technological sectors, smart materials in automotive, bio-manufacturing, chemicals, electronics, energy, and construction materials. The advanced materials, which are progressing nowadays, have novel properties, thus must be fully characterized and studied, in-depth, so they can be incorporated into products that out-perform existing problems. The book has capture emerging areas of materials science and advanced manufacturing engineering and presents the recent trends in research for young researchers, field engineers, and academic professionals"--

ISBN: 9780367275150 :NT5100

LCCN: 2020018334Subjects--Topical Terms:

643390
Materials
--Testing.

LC Class. No.: TA410 / .C457 2020

Dewey Class. No.: 620.1/10287

Characterization, testing, measurement, and metrology /
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245 0 0 $a Characterization, testing, measurement, and metrology / $c edited by Chander Prakash, Sunpreet Singh, and J. Paulo Davim.
250 $a 1st ed.
260 # $a Boca Raton : $b CRC Press, $c c2021.
300 $a xii, 192 p. : $b ill. ; $c 25 cm.
490 0 $a Manufacturing design and technology series
500 $a "Functional materials and advanced manufacturing"--Cover.
504 $a Includes bibliographical references and index.
520 # $a "This book presents the broad aspects of measurement, performance analysis, and characterization for materials and devices by advanced manufacturing processes. The field of measurement and metrology as a pre-condition for maintaining high quality products/devices/systems in materials and advanced manufacturing process applications has grown strongly over the past years. The focus of this book is to present in numerous technological sectors, smart materials in automotive, bio-manufacturing, chemicals, electronics, energy, and construction materials. The advanced materials, which are progressing nowadays, have novel properties, thus must be fully characterized and studied, in-depth, so they can be incorporated into products that out-perform existing problems. The book has capture emerging areas of materials science and advanced manufacturing engineering and presents the recent trends in research for young researchers, field engineers, and academic professionals"-- $c Provided by publisher.
650 # 0 $a Materials $x Testing. $3 643390
700 1 # $a Davim, J. Paulo. $3 681719
700 1 # $a Singh, Sunpreet, $d 1989- $3 1338502
700 1 # $a Prakash, Chander. $e editor. $3 1298115