國立虎尾科技大學 |

3D Microelectronic Packaging = From Architectures to Applications /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	3D Microelectronic Packaging/ edited by Yan Li, Deepak Goyal.
其他題名:	From Architectures to Applications /
其他作者:	Goyal, Deepak.
面頁冊數:	XVII, 622 p. 299 illus., 205 illus. in color.online resource. :
Contained By:	Springer Nature eBook
標題:	Metallic Materials. -
電子資源:	https://doi.org/10.1007/978-981-15-7090-2
ISBN:	9789811570902

3D Microelectronic Packaging = From Architectures to Applications /
3D Microelectronic PackagingFrom Architectures to Applications /[electronic resource] :edited by Yan Li, Deepak Goyal. - 2nd ed. 2021. - XVII, 622 p. 299 illus., 205 illus. in color.online resource. - Springer Series in Advanced Microelectronics,642197-6643 ;. - Springer Series in Advanced Microelectronics,49.

1. Introduction to 3D microelectronic packaging -- 2. 3D packaging architecture and assembly process design -- 3. Fundamentals of TSV processing and reliability -- 4. Mechanical properties of TSV -- 5. Atomistic View of TSV Protrusion/Intrusion -- 6. Fundamentals and failures in Die preparation for 3D packaging -- 7. Direct Cu to Cu bonding and other alternative interconnects in 3D packaging -- 8. Emerging hybrid bonding techniques for 3D packaging -- 9. Fundamental of Thermal Compressive Bonding process, advanced epoxy, and flux materials in 3D packaging -- 10. Fundamentals of solder alloys in 3D packaging -- 11. Fundamentals of electro migration in interconnects of 3D packages -- 12. Fundamentals of heat dissipation in 3D packaging -- 13. Fundamentals of advanced materials and process in substrate technology -- 14. New substrate technologies for 3D packaging. -15. Thermal mechanical and moisture modeling in 3D packaging -- 16. Stress and Strain measurements in 3D packaging -- 17.Processing and Reliability of Solder Interconnections in Stacked Packaging -- 18. Interconnect Quality and Reliability of 3D Packaging -- 19. Fundamentals of automotive reliability of 3D packages -- 20. Fault isolation and failure analysis of 3D packaging.

This book offers a comprehensive reference guide for graduate students and professionals in both academia and industry, covering the fundamentals, architecture, processing details, and applications of 3D microelectronic packaging. It provides readers an in-depth understanding of the latest research and development findings regarding this key industry trend, including TSV, die processing, micro-bumps for LMI and MMI, direct bonding and advanced materials, as well as quality, reliability, fault isolation, and failure analysis for 3D microelectronic packages. Images, tables, and didactic schematics are used to illustrate and elaborate on the concepts discussed. Readers will gain a general grasp of 3D packaging, quality and reliability concerns, and common causes of failure, and will be introduced to developing areas and remaining gaps in 3D packaging that can help inspire future research and development. .

ISBN: 9789811570902

Standard No.: 10.1007/978-981-15-7090-2doiSubjects--Topical Terms:

671028
Metallic Materials.

LC Class. No.: TK7867-7867.5

Dewey Class. No.: 621.3815

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