國立虎尾科技大學 |

Dependable Embedded Systems

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Dependable Embedded Systems / edited by Jörg Henkel, Nikil Dutt.
other author:	Henkel, Jörg.
Description:	XIII, 608 p. 293 illus., 250 illus. in color.online resource. :
Contained By:	Springer Nature eBook
Subject:	Electronic circuits. -
Online resource:	https://doi.org/10.1007/978-3-030-52017-5
ISBN:	9783030520175

Dependable Embedded Systems
Dependable Embedded Systems [electronic resource] /edited by Jörg Henkel, Nikil Dutt. - 1st ed. 2021. - XIII, 608 p. 293 illus., 250 illus. in color.online resource. - Embedded Systems,2193-0155. - Embedded Systems,.

Introduction -- Design of efficient, dependable SoCs based on cross-layer-reliability approach with emphasis on wireless communication as application and DRAM memories -- CRAU: Compositional System-Level Reliability Analysis in the Presence of Uncertainties -- Semantics-aware Soft Error Handling for Embedded Systems using Compiler-OS Interaction -- ARES: Self-Adaptive Coarse-Grained Reconfigurable Architectures as Reliability Enhancers in Embedded Systems -- Cross-Layer Techniques for Dependable Software Execution on Embedded Systems -- Ambrosia: Cross-layer Modeling and Mitigation of Aging Effects in Embedded Systems -- Cross-Layer Dependability for Embedded Hardware/Software Systems -- Fault-Tolerant Computing with Heterogeneous Hardware/Software Hardening Modes -- Robust Computing for Machine Learning-Based Systems -- Hardening embedded system software -- LIFT: Lifting Device-Level Characteristics for Error Resilient System Level Design: A Crosslayer Approach -- VirTherm-3D: Communication Virtualization Enabling System Management for Dependable 3D MPSoCs -- OTERA: Online Test Strategies for Reliable Reconfigurable Architectures -- Variability-Aware Software: Recent Results and Contributions -- EM Lifetime Constrained Optimization for Multi-Segment Power Grid Networks -- Lightweight Software-Assisted Memory Error Correction -- Reliability-Driven Resource Management for Multi-Core Systems-on-Chip -- Monitor Circuits for Device-Circuit Interaction -- PERCIES: Providing Efficient Reliability in Critical Embedded Systems.

Open Access

This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today’s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems; Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers; Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems.

ISBN: 9783030520175

Standard No.: 10.1007/978-3-030-52017-5doiSubjects--Topical Terms:

563332
Electronic circuits.

LC Class. No.: TK7888.4

Dewey Class. No.: 621.3815

Dependable Embedded Systems
LDR:04267nam a22004335i 4500 001 1050562
003 DE-He213
005 20210619123937.0
007 cr nn 008mamaa
008 220103s2021 gw | s |||| 0|eng d
020 $a 9783030520175 $9 978-3-030-52017-5
024 7 $a 10.1007/978-3-030-52017-5 $2 doi
035 $a 978-3-030-52017-5
050 4 $a TK7888.4
072 7 $a TJFC $2 bicssc
072 7 $a TEC008010 $2 bisacsh
072 7 $a TJFC $2 thema
082 0 4 $a 621.3815 $2 23
245 1 0 $a Dependable Embedded Systems $h [electronic resource] / $c edited by Jörg Henkel, Nikil Dutt.
250 $a 1st ed. 2021.
264 1 $a Cham : $b Springer International Publishing : $b Imprint: Springer, $c 2021.
300 $a XIII, 608 p. 293 illus., 250 illus. in color. $b online resource.
336 $a text $b txt $2 rdacontent
337 $a computer $b c $2 rdamedia
338 $a online resource $b cr $2 rdacarrier
347 $a text file $b PDF $2 rda
490 1 $a Embedded Systems, $x 2193-0155
505 0 $a Introduction -- Design of efficient, dependable SoCs based on cross-layer-reliability approach with emphasis on wireless communication as application and DRAM memories -- CRAU: Compositional System-Level Reliability Analysis in the Presence of Uncertainties -- Semantics-aware Soft Error Handling for Embedded Systems using Compiler-OS Interaction -- ARES: Self-Adaptive Coarse-Grained Reconfigurable Architectures as Reliability Enhancers in Embedded Systems -- Cross-Layer Techniques for Dependable Software Execution on Embedded Systems -- Ambrosia: Cross-layer Modeling and Mitigation of Aging Effects in Embedded Systems -- Cross-Layer Dependability for Embedded Hardware/Software Systems -- Fault-Tolerant Computing with Heterogeneous Hardware/Software Hardening Modes -- Robust Computing for Machine Learning-Based Systems -- Hardening embedded system software -- LIFT: Lifting Device-Level Characteristics for Error Resilient System Level Design: A Crosslayer Approach -- VirTherm-3D: Communication Virtualization Enabling System Management for Dependable 3D MPSoCs -- OTERA: Online Test Strategies for Reliable Reconfigurable Architectures -- Variability-Aware Software: Recent Results and Contributions -- EM Lifetime Constrained Optimization for Multi-Segment Power Grid Networks -- Lightweight Software-Assisted Memory Error Correction -- Reliability-Driven Resource Management for Multi-Core Systems-on-Chip -- Monitor Circuits for Device-Circuit Interaction -- PERCIES: Providing Efficient Reliability in Critical Embedded Systems.
506 0 $a Open Access
520 $a This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today’s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems; Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers; Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems.
650 0 $a Electronic circuits. $3 563332
650 0 $a Computer engineering. $3 569006
650 0 $a Internet of things. $3 1023130
650 0 $a Embedded computer systems. $3 562313
650 0 $a Microprocessors. $3 632481
650 1 4 $a Circuits and Systems. $3 670901
650 2 4 $a Cyber-physical systems, IoT. $3 1226036
650 2 4 $a Processor Architectures. $3 669787
700 1 $a Henkel, Jörg. $e author. $4 edt $4 http://id.loc.gov/vocabulary/relators/edt $3 1274510
700 1 $a Dutt, Nikil. $4 edt $4 http://id.loc.gov/vocabulary/relators/edt $3 639623
710 2 $a SpringerLink (Online service) $3 593884
773 0 $t Springer Nature eBook
776 0 8 $i Printed edition: $z 9783030520168
776 0 8 $i Printed edition: $z 9783030520182
776 0 8 $i Printed edition: $z 9783030520199
830 0 $a Embedded Systems, $x 2193-0155 $3 1263133
856 4 0 $u https://doi.org/10.1007/978-3-030-52017-5
912 $a ZDB-2-ENG
912 $a ZDB-2-SXE
912 $a ZDB-2-SOB
950 $a Engineering (SpringerNature-11647)
950 $a Engineering (R0) (SpringerNature-43712)