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Highly Efficient Long-Wavelength Infrared, Step-Taper Active-Region Quantum Cascade Lasers.
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
正題名/作者:
Highly Efficient Long-Wavelength Infrared, Step-Taper Active-Region Quantum Cascade Lasers./
作者:
Oresick, Kevin.
出版者:
Ann Arbor : ProQuest Dissertations & Theses, : 2021,
面頁冊數:
165 p.
附註:
Source: Dissertations Abstracts International, Volume: 83-01, Section: B.
Contained By:
Dissertations Abstracts International83-01B.
標題:
Materials science. -
電子資源:
http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=28547493
ISBN:
9798516930898
Highly Efficient Long-Wavelength Infrared, Step-Taper Active-Region Quantum Cascade Lasers.
Oresick, Kevin.
Highly Efficient Long-Wavelength Infrared, Step-Taper Active-Region Quantum Cascade Lasers.
- Ann Arbor : ProQuest Dissertations & Theses, 2021 - 165 p.
Source: Dissertations Abstracts International, Volume: 83-01, Section: B.
Thesis (Ph.D.)--The University of Wisconsin - Madison, 2021.
This item must not be sold to any third party vendors.
Quantum cascade lasers (QCLs) are semiconductor lasers that emit in the mid- to far-infrared and employ intersubband transitions in multiple quantum-well structures. Conventionally, the active region of QCLs has consisted of quantum wells and barriers of fixed-alloy composition. That has led to severe carrier leakage from the upper-laser level and injector states, evidenced by strong temperature dependences of the device characteristics, which resulted in low values for wall-plug efficiency ηwp of CW-operating devices. We have devised in the past means for carrier-leakage suppression, and have recently derived a comprehensive carrier-leakage formalism that bridges the gap between theoretical and experimental values for the internal efficiency. Here we present a refinement of the comprehensive carrier-leakage formalism and employ it for comparing our band-engineered ~8 μm-emitting QCL, so-called step-tapered active-region (STA), to a conventional ~8 μm-emitting QCL. We find that the internal efficiency reaches a high value of ~73.6%, due to record-high injection- and laser-transition efficiencies. Experimentally we obtain a single-facet ηwp value of 10.6%, a record-high value for 8–11 μm-emitting QCLs grown by MOCVD. Then, by using both band- and interface-roughness (IFR)-scattering - engineering we designed an optimized 8.2 μm-emitting STA-QCL that reaches a record-high injection efficiency of 89.5%. By minimizing the waveguide loss and raising the doping level the device reaches a record-high internal efficiency (80%) for ~8 μm-emitting QCLs as well as a projected ηwp value of 11.2%. The studies are extended to devices of higher layer-interface quality, grown by two different techniques. As a result, we obtain ηwp values as high as 15.6 %. In addition, the optimized STA-QCL has a lower-level lifetime dominated by IFR scattering, which makes it amenable to further optimization via IFR engineering. Finally, we analyze an ~8 μm-emitting QCLs that holds the world record ηwp value, primarily due to low voltages via the realization of photon-induced carrier transport. We find that the device has significant carrier leakage, and show that our optimized STA QCL can reach comparable ηwp values if high-quality interfaces are employed. We then derive ultimate limits for the ηwp value in the 7–11 μm wavelength range.
ISBN: 9798516930898Subjects--Topical Terms:
557839
Materials science.
Subjects--Index Terms:
Band engineering
Highly Efficient Long-Wavelength Infrared, Step-Taper Active-Region Quantum Cascade Lasers.
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Quantum cascade lasers (QCLs) are semiconductor lasers that emit in the mid- to far-infrared and employ intersubband transitions in multiple quantum-well structures. Conventionally, the active region of QCLs has consisted of quantum wells and barriers of fixed-alloy composition. That has led to severe carrier leakage from the upper-laser level and injector states, evidenced by strong temperature dependences of the device characteristics, which resulted in low values for wall-plug efficiency ηwp of CW-operating devices. We have devised in the past means for carrier-leakage suppression, and have recently derived a comprehensive carrier-leakage formalism that bridges the gap between theoretical and experimental values for the internal efficiency. Here we present a refinement of the comprehensive carrier-leakage formalism and employ it for comparing our band-engineered ~8 μm-emitting QCL, so-called step-tapered active-region (STA), to a conventional ~8 μm-emitting QCL. We find that the internal efficiency reaches a high value of ~73.6%, due to record-high injection- and laser-transition efficiencies. Experimentally we obtain a single-facet ηwp value of 10.6%, a record-high value for 8–11 μm-emitting QCLs grown by MOCVD. Then, by using both band- and interface-roughness (IFR)-scattering - engineering we designed an optimized 8.2 μm-emitting STA-QCL that reaches a record-high injection efficiency of 89.5%. By minimizing the waveguide loss and raising the doping level the device reaches a record-high internal efficiency (80%) for ~8 μm-emitting QCLs as well as a projected ηwp value of 11.2%. The studies are extended to devices of higher layer-interface quality, grown by two different techniques. As a result, we obtain ηwp values as high as 15.6 %. In addition, the optimized STA-QCL has a lower-level lifetime dominated by IFR scattering, which makes it amenable to further optimization via IFR engineering. Finally, we analyze an ~8 μm-emitting QCLs that holds the world record ηwp value, primarily due to low voltages via the realization of photon-induced carrier transport. We find that the device has significant carrier leakage, and show that our optimized STA QCL can reach comparable ηwp values if high-quality interfaces are employed. We then derive ultimate limits for the ηwp value in the 7–11 μm wavelength range.
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http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=28547493
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