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Solution Phase Functionalization of Graphene Oxide.

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Solution Phase Functionalization of Graphene Oxide./
作者:	Marston, Antonio C. J., II.
出版者:	Ann Arbor : ProQuest Dissertations & Theses, : 2021,
面頁冊數:	31 p.
附註:	Source: Masters Abstracts International, Volume: 83-02.
Contained By:	Masters Abstracts International83-02.
標題:	Scanning electron microscopy. -
電子資源:	http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=28643211
ISBN:	9798534677652

Solution Phase Functionalization of Graphene Oxide.
Marston, Antonio C. J., II.

Solution Phase Functionalization of Graphene Oxide. - Ann Arbor : ProQuest Dissertations & Theses, 2021 - 31 p.

Source: Masters Abstracts International, Volume: 83-02.

Thesis (M.Sc.)--North Carolina Central University, 2021.

This item must not be sold to any third party vendors.

Graphene is a single sheet of the material graphite and comprises a two-dimensional array of hexagonally organized sp2-hybridized carbon atoms. Graphene is an electrical conductor, and exploration is in progress to synthetically modify the structure of graphene to change it into a semiconductor. Semiconducting graphene could potentially be used to manufacture solid-state electronics that are currently constructed from silicon. Theoretical investigations demonstrate that subtle changes to the graphene structure utilizing η6-bound M(CO)3 or (arene)M fragments (M = Cr, W) may convert graphene into a semiconductor. This project will investigate a solution phase route to this transformation using graphene oxide, which is soluble. The approach involves refluxing a mixture of graphene oxide and M(CO)6 or (arene)M(CO)3 in a high boiling solvent mixture to bind the M(CO)3 or (arene)M fragments to the graphene oxide surface. Preparation and characterization of the products resulting from reaction between the metal containing precursors and graphene oxide will be characterized by using Raman spectroscopy, (X-ray photoelectron spectroscopy (XPS), Transmission electron microscopy (TEM), and Fourier-transform infrared spectroscopy (FTIR). The data collected gave values close to those of Haddon and support compound formation in some cases. This project will enable future researchers to synthesize and more fully characterize the products. An important technique that will be used is Kelvin probe force microscopy (KPFM) to measure and determine possible changes in conductivity of the metal-containing products.

ISBN: 9798534677652Subjects--Topical Terms:

768680
Scanning electron microscopy.
Subjects--Index Terms:

Solution phase transformation

Solution Phase Functionalization of Graphene Oxide.
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520 $a Graphene is a single sheet of the material graphite and comprises a two-dimensional array of hexagonally organized sp2-hybridized carbon atoms. Graphene is an electrical conductor, and exploration is in progress to synthetically modify the structure of graphene to change it into a semiconductor. Semiconducting graphene could potentially be used to manufacture solid-state electronics that are currently constructed from silicon. Theoretical investigations demonstrate that subtle changes to the graphene structure utilizing η6-bound M(CO)3 or (arene)M fragments (M = Cr, W) may convert graphene into a semiconductor. This project will investigate a solution phase route to this transformation using graphene oxide, which is soluble. The approach involves refluxing a mixture of graphene oxide and M(CO)6 or (arene)M(CO)3 in a high boiling solvent mixture to bind the M(CO)3 or (arene)M fragments to the graphene oxide surface. Preparation and characterization of the products resulting from reaction between the metal containing precursors and graphene oxide will be characterized by using Raman spectroscopy, (X-ray photoelectron spectroscopy (XPS), Transmission electron microscopy (TEM), and Fourier-transform infrared spectroscopy (FTIR). The data collected gave values close to those of Haddon and support compound formation in some cases. This project will enable future researchers to synthesize and more fully characterize the products. An important technique that will be used is Kelvin probe force microscopy (KPFM) to measure and determine possible changes in conductivity of the metal-containing products.
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