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Extended defects in semiconductors =...

ProQuest (Firm)

Extended defects in semiconductors = electronic properties, device effects and structures /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Extended defects in semiconductors/ D.B. Holt and B.G. Yacobi.
其他題名:	electronic properties, device effects and structures /
作者:	Holt, D. B.
其他作者:	Yacobi, B. G.
出版者:	Cambridge :Cambridge University Press, : 2007.,
面頁冊數:	xi, 631 p.
標題:	Semiconductors - Failures. -
電子資源:	Click to View

Extended defects in semiconductors = electronic properties, device effects and structures /
Holt, D. B.

Extended defects in semiconductorselectronic properties, device effects and structures /[electronic resource] :D.B. Holt and B.G. Yacobi. - Cambridge :Cambridge University Press,2007. - xi, 631 p.

Includes bibliographical references.

Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.

Subjects--Topical Terms:

670934
Semiconductors
--Failures.Index Terms--Genre/Form:

554714
Electronic books.

LC Class. No.: TK7871.852 / .H65 2007

Dewey Class. No.: 621.38152

Extended defects in semiconductors = electronic properties, device effects and structures /
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