| Record Type: |
Language materials, printed
: Monograph/item
|
| Title/Author: |
Optical metrology for precision engineering // Wei Gao, Yuki Shimizu. |
| Author: |
Gao, Wei. |
| other author: |
Shimizu, Yuki. |
| Published: |
Berlin ;De Gruyter, : c2022., |
| Description: |
xi, 644 p. :ill. (some col.) ; : 25 cm.; |
| Subject: |
Optical measurements. - |
| ISBN: |
3110541092 |