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Introduction to spectroscopic ellipsometry of thin film materials : = instrumentation, data analysis, and applications /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Introduction to spectroscopic ellipsometry of thin film materials :/ Andrew T.S. Wee, Xinmao Yin, Chi Sin Tang.
其他題名:	instrumentation, data analysis, and applications /
作者:	Wee, Andrew T. S.
其他作者:	Tang, Chi Sin.
出版者:	Weinheim :Wiley-VCH, : c2022.,
面頁冊數:	x, 187 p. :ill. (chiefly col.) ; : 25 cm.;
標題:	Spectrum analysis. -
ISBN:	9783527349517 (pbk.) :

Introduction to spectroscopic ellipsometry of thin film materials : = instrumentation, data analysis, and applications /
Wee, Andrew T. S.

Introduction to spectroscopic ellipsometry of thin film materials :instrumentation, data analysis, and applications /Andrew T.S. Wee, Xinmao Yin, Chi Sin Tang. - Weinheim :Wiley-VCH,c2022. - x, 187 p. :ill. (chiefly col.) ;25 cm.

Includes bibliographical references and index.

ISBN: 9783527349517 (pbk.) :NT3259

Nat. Bib. No.: GBC215469bnbSubjects--Topical Terms:

582358
Spectrum analysis.

LC Class. No.: QC176.84.S93 / Y56 2022

Dewey Class. No.: 621.38152

Introduction to spectroscopic ellipsometry of thin film materials : = instrumentation, data analysis, and applications /
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245 1 0 $a Introduction to spectroscopic ellipsometry of thin film materials : $b instrumentation, data analysis, and applications / $c Andrew T.S. Wee, Xinmao Yin, Chi Sin Tang.
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