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Noise Contamination in Nanoscale VLSI Circuits

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Noise Contamination in Nanoscale VLSI Circuits / by Selahattin Sayil.
作者:	Sayil, Selahattin.
面頁冊數:	XI, 136 p. 95 illus., 42 illus. in color.online resource. :
Contained By:	Springer Nature eBook
標題:	Nanoscale Devices. -
電子資源:	https://doi.org/10.1007/978-3-031-12751-9
ISBN:	9783031127519

Noise Contamination in Nanoscale VLSI Circuits
Sayil, Selahattin.

Noise Contamination in Nanoscale VLSI Circuits [electronic resource] /by Selahattin Sayil. - 1st ed. 2022. - XI, 136 p. 95 illus., 42 illus. in color.online resource. - Synthesis Lectures on Digital Circuits & Systems,1932-3174. - Synthesis Lectures on Digital Circuits & Systems,.

Introduction -- Interconnect Noise -- Clock Noise and Uncertainty -- Power Supply Noise -- Substrate Coupling Noise -- Radiation Induced Soft Error Mechanisms -- Thermally Induced Errors -- Impact of Process Variations.

This textbook provides readers with a comprehensive introduction to various noise sources that significantly reduce performance and reliability in nanometer-scale integrated circuits. The author covers different types of noise, such as crosstalk noise caused by signal switching of adjacent wires, power supply noise or IR voltage drop in the power line due to simultaneous buffer / gate switching events, substrate coupling noise, radiation-induced transients, thermally induced noise and noise due to process and environmental Coverages also includes the relationship between some of these noise sources, as well as compound effects, and modeling and mitigation of noise mechanisms.

ISBN: 9783031127519

Standard No.: 10.1007/978-3-031-12751-9doiSubjects--Topical Terms:

1366402
Nanoscale Devices.

LC Class. No.: TK7867-7867.5

Dewey Class. No.: 621.3815

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