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IoT System Testing = An IoT Journey from Devices to Analytics and the Edge /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	IoT System Testing/ by Jon Duncan Hagar.
其他題名:	An IoT Journey from Devices to Analytics and the Edge /
作者:	Hagar, Jon Duncan.
面頁冊數:	XIX, 326 p. 162 illus.online resource. :
Contained By:	Springer Nature eBook
標題:	Artificial Intelligence. -
電子資源:	https://doi.org/10.1007/978-1-4842-8276-2
ISBN:	9781484282762

IoT System Testing = An IoT Journey from Devices to Analytics and the Edge /
Hagar, Jon Duncan.

IoT System TestingAn IoT Journey from Devices to Analytics and the Edge /[electronic resource] :by Jon Duncan Hagar. - 1st ed. 2022. - XIX, 326 p. 162 illus.online resource.

Part I: Getting Started -- Chapter 1: The Internet of Things, V and V, and Testing -- Chapter 2: IoT Technology in Time and Space -- Chapter 3: Big Picture Lessons Learned in IoT Project Test Planning -- Chapter 4: Factors Driving IoT Testing/V and V Selection and Planning -- Chapter 5: Beginner Keys for Starting IoT Test Planning -- Part II: IoT Planning, Test, Strategy and Architecture - Team Leadership -- Chapter 6: IoT Test Plan: Strategy and Architecture Introductions -- Chapter 7: IoT Test Planning and Strategy for Hardware and Software -- Chapter 8: Planning for the IoT Tester on Environments and Testing Details -- Chapter 9: System Engineering Concepts in IoT Test Planning -- Part III: IoT Test Designs and Security Assessments -- Chapter 10: IoT Test Design: Frameworks, Techniques, Attacks, Patterns, and Tours -- Chapter 11: Classic IoT V and V/Test Concepts, Techniques, and Practices -- Chapter 12: Test Approaches and Quality Assessments for IoT Agile/DevOps -- Chapter 13: IoT Software Security Test Attacks and Designs -- Chapter 14: OWASP IoT Information Pointer, and Logging Events -- Chapter 15: Internal Security Team Penetration Test Process -- Chapter 16: IoT Test Environment Introduction -- Part IV: IoT Architectures, Environments, and Integrated Independent Testing -- Chapter 17: Architectures Critical to Project Success -- Chapter 18: Overview of IoT Software Architectures: Products and Testing Support -- Chapter 19: IoT STA System: Software Integration Lab (SIL) Environments -- Chapter 20: Tools for the Software-System Integration Lab (SIL) -- Chapter 21: Environments for Independent Testing and V and V on Large IoT Systems -- Chapter 22: Self-Organizing Data Analytics (SODA): IoT Data Analytics, AI, and Statistics -- Appendix A: IoT Supporting Interface, Hardware, Platform, and Protocol Standards -- Appendix B: Careers in IoT Testing -- Appendix C: IoT Testing Start-up Checklist.

To succeed, teams must assure the quality of IoT systems. The world of technology continually moves from one hot area to another; this book considers the next explosion—of IoT—from a quality testing viewpoint. You'll first gain an introduction to the Internet of Things (IoT), V&V, and testing. Next, you'll be walked through IoT test planning and strategy over the full life cycle, including the impact of data analytics and AI. You will then delve deeper into IoT security testing and various test techniques, patterns, and more. This is followed by a detailed study of IoT software test labs, architecture, environments and AI. There are many options for testing IoT qualities based on the criticality of the software and risks involved; each option has positives, negatives, as well as cost and schedule impacts. The book will guide start-up and experienced teams into these paths and help you to improve the testing and quality assessment of IoT systems. You will: Understand IoT software test architecture and planning Master IoT security testing and test techniques Study IoT test lab automation and architectures Review the need for IoT security, data analytics, AI, Neural Networks and dependability using testing and V&V.

ISBN: 9781484282762

Standard No.: 10.1007/978-1-4842-8276-2doiSubjects--Topical Terms:

646849
Artificial Intelligence.

LC Class. No.: HD61

Dewey Class. No.: 658.155

IoT System Testing = An IoT Journey from Devices to Analytics and the Edge /
LDR:04605nam a22004335i 4500 001 1083210
003 DE-He213
005 20221104133234.0
007 cr nn 008mamaa
008 221228s2022 xxu| s |||| 0|eng d
020 $a 9781484282762 $9 978-1-4842-8276-2
024 7 $a 10.1007/978-1-4842-8276-2 $2 doi
035 $a 978-1-4842-8276-2
050 4 $a HD61
072 7 $a UR $2 bicssc
072 7 $a GPQD $2 bicssc
072 7 $a BUS033070 $2 bisacsh
072 7 $a UR $2 thema
072 7 $a GPQD $2 thema
082 0 4 $a 658.155 $2 23
082 0 4 $a 658.155 $2 23
100 1 $a Hagar, Jon Duncan. $e author. $4 aut $4 http://id.loc.gov/vocabulary/relators/aut $3 1389127
245 1 0 $a IoT System Testing $h [electronic resource] : $b An IoT Journey from Devices to Analytics and the Edge / $c by Jon Duncan Hagar.
250 $a 1st ed. 2022.
264 1 $a Berkeley, CA : $b Apress : $b Imprint: Apress, $c 2022.
300 $a XIX, 326 p. 162 illus. $b online resource.
336 $a text $b txt $2 rdacontent
337 $a computer $b c $2 rdamedia
338 $a online resource $b cr $2 rdacarrier
347 $a text file $b PDF $2 rda
505 0 $a Part I: Getting Started -- Chapter 1: The Internet of Things, V and V, and Testing -- Chapter 2: IoT Technology in Time and Space -- Chapter 3: Big Picture Lessons Learned in IoT Project Test Planning -- Chapter 4: Factors Driving IoT Testing/V and V Selection and Planning -- Chapter 5: Beginner Keys for Starting IoT Test Planning -- Part II: IoT Planning, Test, Strategy and Architecture - Team Leadership -- Chapter 6: IoT Test Plan: Strategy and Architecture Introductions -- Chapter 7: IoT Test Planning and Strategy for Hardware and Software -- Chapter 8: Planning for the IoT Tester on Environments and Testing Details -- Chapter 9: System Engineering Concepts in IoT Test Planning -- Part III: IoT Test Designs and Security Assessments -- Chapter 10: IoT Test Design: Frameworks, Techniques, Attacks, Patterns, and Tours -- Chapter 11: Classic IoT V and V/Test Concepts, Techniques, and Practices -- Chapter 12: Test Approaches and Quality Assessments for IoT Agile/DevOps -- Chapter 13: IoT Software Security Test Attacks and Designs -- Chapter 14: OWASP IoT Information Pointer, and Logging Events -- Chapter 15: Internal Security Team Penetration Test Process -- Chapter 16: IoT Test Environment Introduction -- Part IV: IoT Architectures, Environments, and Integrated Independent Testing -- Chapter 17: Architectures Critical to Project Success -- Chapter 18: Overview of IoT Software Architectures: Products and Testing Support -- Chapter 19: IoT STA System: Software Integration Lab (SIL) Environments -- Chapter 20: Tools for the Software-System Integration Lab (SIL) -- Chapter 21: Environments for Independent Testing and V and V on Large IoT Systems -- Chapter 22: Self-Organizing Data Analytics (SODA): IoT Data Analytics, AI, and Statistics -- Appendix A: IoT Supporting Interface, Hardware, Platform, and Protocol Standards -- Appendix B: Careers in IoT Testing -- Appendix C: IoT Testing Start-up Checklist.
520 $a To succeed, teams must assure the quality of IoT systems. The world of technology continually moves from one hot area to another; this book considers the next explosion—of IoT—from a quality testing viewpoint. You'll first gain an introduction to the Internet of Things (IoT), V&V, and testing. Next, you'll be walked through IoT test planning and strategy over the full life cycle, including the impact of data analytics and AI. You will then delve deeper into IoT security testing and various test techniques, patterns, and more. This is followed by a detailed study of IoT software test labs, architecture, environments and AI. There are many options for testing IoT qualities based on the criticality of the software and risks involved; each option has positives, negatives, as well as cost and schedule impacts. The book will guide start-up and experienced teams into these paths and help you to improve the testing and quality assessment of IoT systems. You will: Understand IoT software test architecture and planning Master IoT security testing and test techniques Study IoT test lab automation and architectures Review the need for IoT security, data analytics, AI, Neural Networks and dependability using testing and V&V.
650 2 4 $a Artificial Intelligence. $3 646849
650 2 4 $a Communications Engineering, Networks. $3 669809
650 1 4 $a IT Risk Management. $3 1366666
650 0 $a Artificial intelligence. $3 559380
650 0 $a Telecommunication. $3 568341
650 0 $a Risk management. $3 559158
710 2 $a SpringerLink (Online service) $3 593884
773 0 $t Springer Nature eBook
776 0 8 $i Printed edition: $z 9781484282755
776 0 8 $i Printed edition: $z 9781484282779
776 0 8 $i Printed edition: $z 9781484291146
856 4 0 $u https://doi.org/10.1007/978-1-4842-8276-2
912 $a ZDB-2-CWD
912 $a ZDB-2-SXPC
950 $a Professional and Applied Computing (SpringerNature-12059)
950 $a Professional and Applied Computing (R0) (SpringerNature-43716)