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Microstructural Characterisation Techniques

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Microstructural Characterisation Techniques/ by Gunturi Venkata Sitarama Sastry.
作者:	Sastry, Gunturi Venkata Sitarama.
面頁冊數:	XIX, 242 p. 209 illus., 60 illus. in color.online resource. :
Contained By:	Springer Nature eBook
標題:	Microscopy. -
電子資源:	https://doi.org/10.1007/978-981-19-3509-1
ISBN:	9789811935091

Microstructural Characterisation Techniques
Sastry, Gunturi Venkata Sitarama.

Microstructural Characterisation Techniques[electronic resource] /by Gunturi Venkata Sitarama Sastry. - 1st ed. 2022. - XIX, 242 p. 209 illus., 60 illus. in color.online resource. - Indian Institute of Metals Series,2509-6419. - Indian Institute of Metals Series,.

Introduction -- Electromagnetic Waves and Electron Waves -- Fourier Analysis and Fourier Transformation -- Transmission Electron Microscope -- Electron Diffraction -- Optical Microscopy -- Transmission Electron Microscopy -- Lens-less Electron Microscopy.

This textbook is aimed at graduate and upper undergraduate students studying materials science and metallurgy. It comprehensively covers the topic of microstructural characterization and includes an emphasis on Fourier analysis and Fourier transformation, electron diffraction, electromagnetic waves and electron waves, lens parameters, transmission electron microscopy, optical microscopy and scanning electron microscopy. The author has included pedagogical features such as end-of-chapter exercises and worked examples with varying degrees of difficulty to augment learning and self-testing. This book will be a useful guide for upper undergraduate and graduate students along with researchers and professionals working in the field of microstructural characterization.

ISBN: 9789811935091

Standard No.: 10.1007/978-981-19-3509-1doiSubjects--Topical Terms:

582141
Microscopy.

LC Class. No.: TA459-492

Dewey Class. No.: 620.16

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