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Tantalum and Niobium-Based Capacitors = Science, Technology, and Applications /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Tantalum and Niobium-Based Capacitors/ by Yuri Freeman.
其他題名:	Science, Technology, and Applications /
作者:	Freeman, Yuri.
面頁冊數:	XXI, 149 p. 119 illus., 50 illus. in color.online resource. :
Contained By:	Springer Nature eBook
標題:	Electronics and Microelectronics, Instrumentation. -
電子資源:	https://doi.org/10.1007/978-3-030-89514-3
ISBN:	9783030895143

Tantalum and Niobium-Based Capacitors = Science, Technology, and Applications /
Freeman, Yuri.

Tantalum and Niobium-Based CapacitorsScience, Technology, and Applications /[electronic resource] :by Yuri Freeman. - 2nd ed. 2022. - XXI, 149 p. 119 illus., 50 illus. in color.online resource.

Introduction -- 1: Major Degradation Mechanisms -- 2: Basic Technology -- 3: Applications -- 4: Conclusion.

This book provides a comprehensive analysis of the science, technology, and applications of Tantalum and Niobium-based capacitors. The author discusses fundamentals, focusing on thermodynamic stability, major degradation processes and conduction mechanisms in the basic structure of Me-Me2O5-cathode (Me: Ta, Nb). Technology-related coverage includes chapters on the major manufacturing steps from capacitor grade powder to the testing of finished capacitors. Applications include high reliability, high charge and energy efficiency, high working voltages, high temperatures, etc. The links between the scientific foundation, breakthrough technologies and outstanding performance and reliability of the capacitors are demonstrated. The theoretical models discussed include the thermodynamics of the amorphous dielectrics, conduction mechanisms in metal-insulator-semiconductor (MIS) structures, band diagrams of the organic semiconductors, etc. Provides a single-source reference to the science, technology, and applications of Tantalum and Niobium-based capacitors; Focuses on Polymer Tantalum capacitors, with rapidly growing applications in special and commercial electronics; Discusses in detail conduction and degradation mechanisms in amorphous dielectrics and multilayer capacitor structures with amorphous dielectrics, such as metal-insulator-semiconductor (MIS) structures with inorganic and organic semiconductors, as well as MOSFET transistors with high k dielectrics.

ISBN: 9783030895143

Standard No.: 10.1007/978-3-030-89514-3doiSubjects--Topical Terms:

670219
Electronics and Microelectronics, Instrumentation.

LC Class. No.: TK7867-7867.5

Dewey Class. No.: 621.3815

Tantalum and Niobium-Based Capacitors = Science, Technology, and Applications /
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