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Electron Microscopy in Science and Engineering

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Electron Microscopy in Science and Engineering/ edited by Krishanu Biswas, Sri Sivakumar, Nilesh Gurao.
其他作者:	Gurao, Nilesh.
面頁冊數:	XII, 147 p. 152 illus., 134 illus. in color.online resource. :
Contained By:	Springer Nature eBook
標題:	Structural Materials. -
電子資源:	https://doi.org/10.1007/978-981-16-5101-4
ISBN:	9789811651014

Electron Microscopy in Science and Engineering
Electron Microscopy in Science and Engineering[electronic resource] /edited by Krishanu Biswas, Sri Sivakumar, Nilesh Gurao. - 1st ed. 2022. - XII, 147 p. 152 illus., 134 illus. in color.online resource. - IITK Directions,62509-6605 ;. - IITK Directions,2.

Small scale deformation experiments inside an SEM -- In-situ Micromechanical Testing in Scanning Electron Microscopy -- Exploring Carbon Surface using Electron Microscopy: Applications to Energy, Environment and Health -- Electron Backscatter Diffraction Technique: Fundamentals to Applications -- Application of Electron backscatter diffraction (EBSD) method in Earth Sciences -- Electron Probe Micro-Analyser: An Equipment for Accurate and Precise Micro-Composition Analysis.

This issue of Direction focuses on the rapid proliferation of electron microscopy (EM) for scientific as well as technological research. The content written by leading experts is intended to provide the capabilities of EM facilities, set at Indian Institute of Technology (IIT) Kanpur to solve various problems and caters to the needs of both internal and external users. The book provides a detailed and comprehensive viewpoint of the basic features and advanced capabilities of EM facilities to the scientific community. A large number of electron microscopes have been installed and utilized by researchers across various engineering and science departments; hence, this volume provides both breadth as well as depth of various EM facilities available at the institute.

ISBN: 9789811651014

Standard No.: 10.1007/978-981-16-5101-4doiSubjects--Topical Terms:

677176
Structural Materials.

LC Class. No.: TA401-492

Dewey Class. No.: 620.11

Electron Microscopy in Science and Engineering
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