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Ion Beam Induced Defects and Their Effects in Oxide Materials

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Ion Beam Induced Defects and Their Effects in Oxide Materials/ by Parmod Kumar, Jitendra Pal Singh, Vinod Kumar, K. Asokan.
作者:	Kumar, Parmod.
其他作者:	Asokan, K.
面頁冊數:	X, 61 p. 28 illus., 25 illus. in color.online resource. :
Contained By:	Springer Nature eBook
標題:	Optoelectronic Devices. -
電子資源:	https://doi.org/10.1007/978-3-030-93862-8
ISBN:	9783030938628

Ion Beam Induced Defects and Their Effects in Oxide Materials
Kumar, Parmod.

Ion Beam Induced Defects and Their Effects in Oxide Materials[electronic resource] /by Parmod Kumar, Jitendra Pal Singh, Vinod Kumar, K. Asokan. - 1st ed. 2022. - X, 61 p. 28 illus., 25 illus. in color.online resource. - SpringerBriefs in Physics,2191-5431. - SpringerBriefs in Physics,.

Introduction to Ion Beam Techniques -- Swift Heavy Ion Irradiation -- Low Energy Ion Irradiation -- Consequences of Ion Interaction -- Investigation of Defects in Oxides for Various Applications -- Summary and Future Prospects.

This book provides an overview of the applications of ion beam techniques in oxide materials. Oxide materials exhibit defect-induced physical properties relevant to applications in sensing, optoelectronics and spintronics. Defects in these oxide materials also lead to magnetism in non-magnetic materials or to a change of magnetic ordering in magnetic materials. Thus, an understanding of defects is of immense importance. To date, ion beam tools are considered the most effective techniques for producing controlled defects in these oxides. This book will detail the ion beam tools utilized for creating defects in oxides.

ISBN: 9783030938628

Standard No.: 10.1007/978-3-030-93862-8doiSubjects--Topical Terms:

1389863
Optoelectronic Devices.

LC Class. No.: QC173.45-173.458

Dewey Class. No.: 530.41

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