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Spectroscopy for materials characterization

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Spectroscopy for materials characterization/ edited by Simonpietro Agnello.
其他作者:	Agnello, Simonpietro.
出版者:	Hoboken, NJ :Wiley, : 2021.,
面頁冊數:	1 online resource.
標題:	Spectrum analysis. -
電子資源:	https://onlinelibrary.wiley.com/doi/book/10.1002/9781119698029
ISBN:	9781119698029

Spectroscopy for materials characterization
Spectroscopy for materials characterization[electronic resource] /edited by Simonpietro Agnello. - Hoboken, NJ :Wiley,2021. - 1 online resource.

Includes bibliographical references and index.

Radiation-Matter Interaction Principles / Simonpietro Agnello -- Time-Resolved Photoluminescence / Marco Cannas, Lavinia Vaccaro -- Ultrafast Optical Spectroscopies / Alice Sciortino, Fabrizio Messina -- Confocal and Two-Photon Spectroscopy / Giuseppe Sancataldo, Valeria Vetri -- Infrared Absorption Spectroscopy / Tiziana Fiore, Claudia Pellerito -- Raman and Micro-Raman Spectroscopy / Giuliana Faggio, Rossella Grillo, Giacomo Messina -- Thermally Stimulated Luminescence / Federico Moretti -- Spectroscopic Studies of Radiation Effects on Optical Materials / Sylvain Girard, Vincenzo De Michele, Adriana Morana -- Electron Paramagnetic Resonance Spectroscopy (EPR) / Antonino Alessi, Franco Gelardi -- Nuclear Magnetic Resonance Spectroscopy / Alberto Spinella, Pellegrino Conte -- X-Ray Absorption Spectroscopy and X-Ray Raman Scattering Spectroscopy for Energy Applications / Alessandro Longo, Francesco Giannici, Christoph J Sahle -- X-Ray Photoelectron Spectroscopy / Michelangelo Scopelliti -- Ultraviolet Photoelectron Spectroscopy - Materials Science Technique / Dmitry A Zatsepin, Anatoly F Zatsepin -- Transmission Electron Spectroscopy / Raffaele Giuseppe Agostino, Vincenzo Formoso -- Atomic Force Microscopy and Spectroscopy / Gianpiero Buscarino.

ISBN: 9781119698029

Standard No.: 10.1002/9781119698029doiSubjects--Topical Terms:

582358
Spectrum analysis.

LC Class. No.: TA417.2

Dewey Class. No.: 620.1/127

Spectroscopy for materials characterization
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245 0 0 $a Spectroscopy for materials characterization $h [electronic resource] / $c edited by Simonpietro Agnello.
260 $a Hoboken, NJ : $b Wiley, $c 2021.
300 $a 1 online resource.
504 $a Includes bibliographical references and index.
505 0 $a Radiation-Matter Interaction Principles / Simonpietro Agnello -- Time-Resolved Photoluminescence / Marco Cannas, Lavinia Vaccaro -- Ultrafast Optical Spectroscopies / Alice Sciortino, Fabrizio Messina -- Confocal and Two-Photon Spectroscopy / Giuseppe Sancataldo, Valeria Vetri -- Infrared Absorption Spectroscopy / Tiziana Fiore, Claudia Pellerito -- Raman and Micro-Raman Spectroscopy / Giuliana Faggio, Rossella Grillo, Giacomo Messina -- Thermally Stimulated Luminescence / Federico Moretti -- Spectroscopic Studies of Radiation Effects on Optical Materials / Sylvain Girard, Vincenzo De Michele, Adriana Morana -- Electron Paramagnetic Resonance Spectroscopy (EPR) / Antonino Alessi, Franco Gelardi -- Nuclear Magnetic Resonance Spectroscopy / Alberto Spinella, Pellegrino Conte -- X-Ray Absorption Spectroscopy and X-Ray Raman Scattering Spectroscopy for Energy Applications / Alessandro Longo, Francesco Giannici, Christoph J Sahle -- X-Ray Photoelectron Spectroscopy / Michelangelo Scopelliti -- Ultraviolet Photoelectron Spectroscopy - Materials Science Technique / Dmitry A Zatsepin, Anatoly F Zatsepin -- Transmission Electron Spectroscopy / Raffaele Giuseppe Agostino, Vincenzo Formoso -- Atomic Force Microscopy and Spectroscopy / Gianpiero Buscarino.
588 $a Description based on print version record.
650 0 $a Spectrum analysis. $3 582358
650 0 $a Materials $x Testing. $3 643390
700 1 $a Agnello, Simonpietro. $3 1346013
856 4 0 $u https://onlinelibrary.wiley.com/doi/book/10.1002/9781119698029