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Vlsi design and test = 26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022 : revised selected papers /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Vlsi design and test/ edited by Ambika Prasad Shah ... [et al.].
其他題名:	26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022 : revised selected papers /
其他題名:	VDAT 2022
其他作者:	Shah, Ambika Prasad.
團體作者:	Workshop on the Preservation of Stability under Discretization
出版者:	Cham :Springer Nature Switzerland : : 2022.,
面頁冊數:	xviii, 596 p. :ill. (some col.), digital ; : 24 cm.;
Contained By:	Springer Nature eBook
標題:	Integrated circuits - Textbooks. - Very large scale integration -
電子資源:	https://doi.org/10.1007/978-3-031-21514-8
ISBN:	9783031215148

Vlsi design and test = 26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022 : revised selected papers /
Vlsi design and test26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022 : revised selected papers /[electronic resource] :VDAT 2022edited by Ambika Prasad Shah ... [et al.]. - Cham :Springer Nature Switzerland :2022. - xviii, 596 p. :ill. (some col.), digital ;24 cm. - Communications in computer and information science,16871865-0937 ;. - Communications in computer and information science ;311..

This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022. The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. They were organized in topical sections as follows: Devices and Technology; Sensors; Analog/Mixed Signal; Digital Design; Emerging Technologies and Memory; System Design.

ISBN: 9783031215148

Standard No.: 10.1007/978-3-031-21514-8doiSubjects--Topical Terms:

681124
Integrated circuits
--Very large scale integration--Textbooks.

LC Class. No.: TK7874.75

Dewey Class. No.: 621.395

Vlsi design and test = 26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022 : revised selected papers /
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