• Modern characterization of electromagnetic systems and its associated metrology /
  • Record Type: Language materials, printed : Monograph/item
    Title/Author: Modern characterization of electromagnetic systems and its associated metrology // Tapan K. Sarkar ... [et al.]
    other author: Sarkar, Tapan
    Published: Hoboken, NJ :John Wiley & Sons, Inc., : c2021.,
    Description: xxviii, 692 p. :ill. (some col.) ; : 24 cm.;
    Subject: Electromagnetism - Mathematics. -
    ISBN: 9781119076469 (hbk.) :
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  • 1 records • Pages 1 •
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