Record Type: |
Language materials, printed
: Monograph/item
|
Title/Author: |
Modern characterization of electromagnetic systems and its associated metrology // Tapan K. Sarkar ... [et al.] |
other author: |
Sarkar, Tapan |
Published: |
Hoboken, NJ :John Wiley & Sons, Inc., : c2021., |
Description: |
xxviii, 692 p. :ill. (some col.) ; : 24 cm.; |
Subject: |
Electromagnetism - Mathematics. - |
ISBN: |
9781119076469 (hbk.) : |