語系:
繁體中文
English
說明(常見問題)
登入
回首頁
切換:
標籤
|
MARC模式
|
ISBD
Analytical methods and instruments for micro- and nanomaterials
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
正題名/作者:
Analytical methods and instruments for micro- and nanomaterials/ by Henry H. Radamson ... [et al.].
其他作者:
Radamson, Henry H.
出版者:
Cham :Springer International Publishing : : 2023.,
面頁冊數:
xvi, 282 p. :ill., digital ; : 24 cm.;
Contained By:
Springer Nature eBook
標題:
Nanotechnology. -
電子資源:
https://doi.org/10.1007/978-3-031-26434-4
ISBN:
9783031264344
Analytical methods and instruments for micro- and nanomaterials
Analytical methods and instruments for micro- and nanomaterials
[electronic resource] /by Henry H. Radamson ... [et al.]. - Cham :Springer International Publishing :2023. - xvi, 282 p. :ill., digital ;24 cm. - Lecture notes in nanoscale science and technology,v. 232195-2167 ;. - Lecture notes in nanoscale science and technology ;13..
Part one: Material Characterization using Photons and Electrons -- X-ray diffraction techniques -- Micro-photoluminescence (µ-PL) -- Spectroscopy techniques -- Electron Microscopy -- Part two: Material Characterization using Ions -- Rutherford backscattering Spectroscopy -- Secondary ion mass spectroscopy -- Part three: Electrical Measurements -- Electrical Characterization techniques -- Part four: Scanning Probe Techniques -- Scanning Probe Microscopies (SPMs)
This book describes analytical instruments widely used to characterize the nanostructured materials. It provides information about how to assess material quality, defects, the state of surfaces and interfaces, element distributions, strain, lattice distortion, and electro-optical properties of materials and devices. The information provided by this book can be used as a back-up for material processing, material design and debugging of device performance. The basic principles and methodology of each analysis technique is described in separate chapters, adding historic perspectives and recent developments. The data analysis, from simple to advanced level, is introduced by numerous examples, mostly taken from the authors' fields of research; semiconductor materials, metals and oxides. The book serves as a valuable guide for scientists and students working in materials science, physics, and engineering, who wish to become acquainted with the most important analytical techniques for nanomaterials.
ISBN: 9783031264344
Standard No.: 10.1007/978-3-031-26434-4doiSubjects--Topical Terms:
557660
Nanotechnology.
LC Class. No.: TA418.9.N35
Dewey Class. No.: 620.115
Analytical methods and instruments for micro- and nanomaterials
LDR
:02572nam a2200337 a 4500
001
1115828
003
DE-He213
005
20230810132227.0
006
m d
007
cr nn 008maaau
008
240123s2023 sz s 0 eng d
020
$a
9783031264344
$q
(electronic bk.)
020
$a
9783031264337
$q
(paper)
024
7
$a
10.1007/978-3-031-26434-4
$2
doi
035
$a
978-3-031-26434-4
040
$a
GP
$c
GP
041
0
$a
eng
050
4
$a
TA418.9.N35
072
7
$a
TGMT
$2
bicssc
072
7
$a
TEC021000
$2
bisacsh
072
7
$a
TGMT
$2
thema
082
0 4
$a
620.115
$2
23
090
$a
TA418.9.N35
$b
A532 2023
245
0 0
$a
Analytical methods and instruments for micro- and nanomaterials
$h
[electronic resource] /
$c
by Henry H. Radamson ... [et al.].
260
$a
Cham :
$c
2023.
$b
Springer International Publishing :
$b
Imprint: Springer,
300
$a
xvi, 282 p. :
$b
ill., digital ;
$c
24 cm.
490
1
$a
Lecture notes in nanoscale science and technology,
$x
2195-2167 ;
$v
v. 23
505
0
$a
Part one: Material Characterization using Photons and Electrons -- X-ray diffraction techniques -- Micro-photoluminescence (µ-PL) -- Spectroscopy techniques -- Electron Microscopy -- Part two: Material Characterization using Ions -- Rutherford backscattering Spectroscopy -- Secondary ion mass spectroscopy -- Part three: Electrical Measurements -- Electrical Characterization techniques -- Part four: Scanning Probe Techniques -- Scanning Probe Microscopies (SPMs)
520
$a
This book describes analytical instruments widely used to characterize the nanostructured materials. It provides information about how to assess material quality, defects, the state of surfaces and interfaces, element distributions, strain, lattice distortion, and electro-optical properties of materials and devices. The information provided by this book can be used as a back-up for material processing, material design and debugging of device performance. The basic principles and methodology of each analysis technique is described in separate chapters, adding historic perspectives and recent developments. The data analysis, from simple to advanced level, is introduced by numerous examples, mostly taken from the authors' fields of research; semiconductor materials, metals and oxides. The book serves as a valuable guide for scientists and students working in materials science, physics, and engineering, who wish to become acquainted with the most important analytical techniques for nanomaterials.
650
2 4
$a
Nanotechnology.
$3
557660
650
2 4
$a
Optical Materials.
$3
1366413
650
2 4
$a
Spectroscopy.
$3
1102161
650
2 4
$a
Nanophysics.
$3
1366414
650
1 4
$a
Characterization and Analytical Technique.
$3
1366464
650
0
$a
Nanostructured materials
$x
Analysis.
$3
783961
700
1
$a
Radamson, Henry H.
$3
1027789
710
2
$a
SpringerLink (Online service)
$3
593884
773
0
$t
Springer Nature eBook
830
0
$a
Lecture notes in nanoscale science and technology ;
$v
13.
$3
885319
856
4 0
$u
https://doi.org/10.1007/978-3-031-26434-4
950
$a
Chemistry and Materials Science (SpringerNature-11644)
筆 0 讀者評論
多媒體
評論
新增評論
分享你的心得
Export
取書館別
處理中
...
變更密碼[密碼必須為2種組合(英文和數字)及長度為10碼以上]
登入