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Characterization of high Tc materials and devices by electron microscopy /

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Characterization of high Tc materials and devices by electron microscopy // edited by Nigel D. Browning, Stephen J. Pennycook.
remainder title:	Characterization of High Tc Materials & Devices by Electron Microscopy
other author:	Browning, Nigel D.,
Description:	1 online resource (xii, 391 pages) :digital, PDF file(s). :
Notes:	Title from publisher's bibliographic system (viewed on 05 Oct 2015).
Subject:	High temperature superconductors. -
Online resource:	https://doi.org/10.1017/CBO9780511534829
ISBN:	9780511534829 (ebook)

Characterization of high Tc materials and devices by electron microscopy /
Characterization of high Tc materials and devices by electron microscopy /Characterization of High Tc Materials & Devices by Electron Microscopyedited by Nigel D. Browning, Stephen J. Pennycook. - 1 online resource (xii, 391 pages) :digital, PDF file(s).

Title from publisher's bibliographic system (viewed on 05 Oct 2015).

High-resolution transmission electron microscopy /S. Horiuchi and L. He --1.

This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included.

ISBN: 9780511534829 (ebook)Subjects--Topical Terms:

671149
High temperature superconductors.

LC Class. No.: QC611.98.H54 / C43 2000

Dewey Class. No.: 537.6/23/0284

Characterization of high Tc materials and devices by electron microscopy /
LDR:03036nam a2200313 i 4500 001 1124259
003 UkCbUP
005 20151005020621.0
006 m|||||o||d||||||||
007 cr||||||||||||
008 240926s2000||||enk o ||1 0|eng|d
020 $a 9780511534829 (ebook)
020 $z 9780521554909 (hardback)
020 $z 9780521031707 (paperback)
035 $a CR9780511534829
040 $a UkCbUP $b eng $e rda $c UkCbUP
050 0 0 $a QC611.98.H54 $b C43 2000
082 0 0 $a 537.6/23/0284 $2 21
245 0 0 $a Characterization of high Tc materials and devices by electron microscopy / $c edited by Nigel D. Browning, Stephen J. Pennycook.
246 3 $a Characterization of High Tc Materials & Devices by Electron Microscopy
264 1 $a Cambridge : $b Cambridge University Press, $c 2000.
300 $a 1 online resource (xii, 391 pages) : $b digital, PDF file(s).
336 $a text $b txt $2 rdacontent
337 $a computer $b c $2 rdamedia
338 $a online resource $b cr $2 rdacarrier
500 $a Title from publisher's bibliographic system (viewed on 05 Oct 2015).
505 0 0 $g 1. $t High-resolution transmission electron microscopy / $r S. Horiuchi and L. He -- $g 2. $t Holography in the transmission electron microscope / $r A. Tonomura -- $g 3. $t Microanalysis by scanning transmission electron microscopy / $r L.M. Brown and J. Yuan -- $g 4. $t Specimen preparation for transmission electron microscopy / $r J.G. Wen -- $g 5. $t Low-temperature scanning electron microscopy / $r R.P. Huebener -- $g 6. $t Scanning tunneling microscopy / $r M.E. Hawley -- $g 7. $t Identification of new superconducting compounds by electron microscopy / $r G. Van Tendeloo and T. Krekels -- $g 8. $t Valence band electron energy loss spectroscopy (EELS) of oxide superconductors / $r Y.Y. Wang and V.P. Dravid.
520 $a This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included.
650 0 $a High temperature superconductors. $3 671149
650 0 $a Electron microscopy $x Technique. $3 745425
700 1 $a Browning, Nigel D., $e editor. $3 1441673
700 1 $a Pennycook, Stephen J., $e editor. $3 1441674
776 0 8 $i Print version: $z 9780521554909
856 4 0 $u https://doi.org/10.1017/CBO9780511534829