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Thin film materials : = stress, defect formation, and surface evolution /

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Thin film materials :/ L.B. Freund, S. Suresh.
Reminder of title:	stress, defect formation, and surface evolution /
Author:	Freund, L. B.,
other author:	Suresh, S.
Description:	1 online resource (xviii, 750 pages) :digital, PDF file(s). :
Notes:	Title from publisher's bibliographic system (viewed on 05 Oct 2015).
Subject:	Thin films. -
Online resource:	https://doi.org/10.1017/CBO9780511754715
ISBN:	9780511754715 (ebook)

Thin film materials : = stress, defect formation, and surface evolution /
Freund, L. B.,

Thin film materials :stress, defect formation, and surface evolution /L.B. Freund, S. Suresh. - 1 online resource (xviii, 750 pages) :digital, PDF file(s).

Title from publisher's bibliographic system (viewed on 05 Oct 2015).

Thin film mechanical behavior and stress presents a technological challenge for materials scientists, physicists and engineers. This book provides a comprehensive coverage of the major issues and topics dealing with stress, defect formation, surface evolution and allied effects in thin film materials. Physical phenomena are examined from the continuum down to the sub-microscopic length scales, with the connections between the structure of the material and its behavior described. Theoretical concepts are underpinned by discussions on experimental methodology and observations. Fundamental scientific concepts are embedded through sample calculations, a broad range of case studies with practical applications, thorough referencing, and end of chapter problems. With solutions to problems available on-line, this book will be essential for graduate courses on thin films and the classic reference for researchers in the field.

ISBN: 9780511754715 (ebook)Subjects--Topical Terms:

560219
Thin films.

LC Class. No.: TA418.9.T45 / F74 2003

Dewey Class. No.: 621.3815/2

Thin film materials : = stress, defect formation, and surface evolution /
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500 $a Title from publisher's bibliographic system (viewed on 05 Oct 2015).
520 $a Thin film mechanical behavior and stress presents a technological challenge for materials scientists, physicists and engineers. This book provides a comprehensive coverage of the major issues and topics dealing with stress, defect formation, surface evolution and allied effects in thin film materials. Physical phenomena are examined from the continuum down to the sub-microscopic length scales, with the connections between the structure of the material and its behavior described. Theoretical concepts are underpinned by discussions on experimental methodology and observations. Fundamental scientific concepts are embedded through sample calculations, a broad range of case studies with practical applications, thorough referencing, and end of chapter problems. With solutions to problems available on-line, this book will be essential for graduate courses on thin films and the classic reference for researchers in the field.
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