國立虎尾科技大學 |

Electron microprobe analysis and scanning electron microscopy in geology /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Electron microprobe analysis and scanning electron microscopy in geology // S.J.B. Reed.
其他題名:	Electron Microprobe Analysis & Scanning Electron Microscopy in Geology
作者:	Reed, S. J. B.,
面頁冊數:	1 online resource (xiii, 189 pages) :digital, PDF file(s). :
附註:	Title from publisher's bibliographic system (viewed on 05 Oct 2015).
標題:	Scanning electron microscopy. -
電子資源:	https://doi.org/10.1017/CBO9780511610561
ISBN:	9780511610561 (ebook)

Electron microprobe analysis and scanning electron microscopy in geology /
Reed, S. J. B.,

Electron microprobe analysis and scanning electron microscopy in geology /Electron Microprobe Analysis & Scanning Electron Microscopy in GeologyS.J.B. Reed. - Second edition. - 1 online resource (xiii, 189 pages) :digital, PDF file(s).

Title from publisher's bibliographic system (viewed on 05 Oct 2015).

Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.

ISBN: 9780511610561 (ebook)Subjects--Topical Terms:

768680
Scanning electron microscopy.

LC Class. No.: QE440 / .R43 2005

Dewey Class. No.: 551.8

Electron microprobe analysis and scanning electron microscopy in geology /
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500 $a Title from publisher's bibliographic system (viewed on 05 Oct 2015).
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650 0 $a Electron probe microanalysis. $3 1444278
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