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Advanced mathematical and computational tools in metrology and testing XII

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Advanced mathematical and computational tools in metrology and testing XII/ editors, F. Pavese ... [et al.]
other author:	Pavese, Franco.
Published:	Singapore ;World Scientific, : c2022.,
Description:	1 online resource :ill. :
Subject:	Metrology. -
Online resource:	https://www.worldscientific.com/worldscibooks/10.1142/12422#t=toc
ISBN:	9789811242380

Advanced mathematical and computational tools in metrology and testing XII
Advanced mathematical and computational tools in metrology and testing XII[electronic resource] /editors, F. Pavese ... [et al.] - 1st ed. - Singapore ;World Scientific,c2022. - 1 online resource :ill. - Series on advances in mathematics for applied sciences,Vol. 901793-0901 ;. - Series on advances in mathematics for applied sciences ;v. 83..

Includes bibliographical references and indexes.

"Description of state-of-the-art techniques for modeling measurement systems and analyzing measurement data. Written by researchers active in institutions developing world-leading measurement capabilities. Provides a multi-disciplinary approach to addressing measurement challenges in a wide range of application domains"--

ISBN: 9789811242380

LCCN: 2021060087Subjects--Topical Terms:

786241
Metrology.

LC Class. No.: QC88 / .A382 2022

Dewey Class. No.: 551.501/5195

Advanced mathematical and computational tools in metrology and testing XII
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020 $a 9789811242380 $q (ebook for institutions)
020 $a 9789811242397 $q (ebook for individuals)
020 $z 9789811242373 $q (hardcover)
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040 $a DLC $b eng $c DLC $d DLC
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050 0 0 $a QC88 $b .A382 2022
082 0 0 $a 551.501/5195 $2 23
245 0 0 $a Advanced mathematical and computational tools in metrology and testing XII $h [electronic resource] / $c editors, F. Pavese ... [et al.]
250 $a 1st ed.
260 $a Singapore ; $a Hackensack, NJ : $b World Scientific, $c c2022.
300 $a 1 online resource : $b ill.
490 1 $a Series on advances in mathematics for applied sciences, $x 1793-0901 ; $v Vol. 90
504 $a Includes bibliographical references and indexes.
520 $a "Description of state-of-the-art techniques for modeling measurement systems and analyzing measurement data. Written by researchers active in institutions developing world-leading measurement capabilities. Provides a multi-disciplinary approach to addressing measurement challenges in a wide range of application domains"-- $c Provided by publisher.
588 $a Description based on print version record.
650 0 $a Metrology. $3 786241
650 0 $a Statistics. $3 556824
700 1 $a Pavese, Franco. $3 791996
830 0 $a Series on advances in mathematics for applied sciences ; $v v. 83. $3 856843
856 4 0 $u https://www.worldscientific.com/worldscibooks/10.1142/12422#t=toc

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