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Self-Reported Impacts of a Low-Risk Testing System on Student Learning Experiences.

紀錄類型:	書目-語言資料,手稿 : Monograph/item
正題名/作者:	Self-Reported Impacts of a Low-Risk Testing System on Student Learning Experiences./
作者:	Kamin, Jeremy.
面頁冊數:	1 online resource (164 pages)
附註:	Source: Masters Abstracts International, Volume: 84-04.
Contained By:	Masters Abstracts International84-04.
標題:	Science education. -
電子資源:	click for full text (PQDT)
ISBN:	9798845423511

Self-Reported Impacts of a Low-Risk Testing System on Student Learning Experiences.
Kamin, Jeremy.

Self-Reported Impacts of a Low-Risk Testing System on Student Learning Experiences. - 1 online resource (164 pages)

Source: Masters Abstracts International, Volume: 84-04.

Thesis (M.S.)--New Mexico State University, 2022.

Includes bibliographical references

We explore the effects a novel exam framing, which we refer to as ``Low-Risk Testing,'' on student learning experiences in an Intermediate Mathematical Methods physics class at New Mexico State University. While the traditional In-Class Timed Exam confronts students with a high-stakes, make-or-break assessment, the framework of Low-Risk Testing we present here seeks to bracket the In-Class Timed Exam with a transparent Practice Exam completed in class beforehand, and a take-home Post-Exam Practice Assignment afterwards. The Post-Exam Practice Assignment, which like the In-Class Timed Exam is graded for correctness, can be used to recover a percentage of lost points on the In-Class Timed Exam. Student responses were obtained through recorded and transcribed interviews during and after the semester. Participants' self-reported experiences revealed common themes of Anxiety, Alignment with course materials, Time, and Metacognition. Students reported significant benefits to overcoming their anxiety from using the Low-Risk Testing (LRT) system, as well as significant benefits from the broader Alignment of the exam sequence with other integrated course components. We regard both LRT and Alignment as two integrated components of a single course-design paradigm, which we refer to as the Alignment and Low-Risk Testing (ALRT) system. Based on these results, we envision further refinements of the ALRT system and potential quantitative metrics which could be used to measure its impact in future studies.

Electronic reproduction.
Ann Arbor, Mich. :
ProQuest,
2024

Mode of access: World Wide Web

ISBN: 9798845423511Subjects--Topical Terms:

1151737
Science education.
Subjects--Index Terms:

Physics education researchIndex Terms--Genre/Form:

554714
Electronic books.

Self-Reported Impacts of a Low-Risk Testing System on Student Learning Experiences.
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