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Fabrication of Tungsten Oxide Thin Film on Stainless Steel by Sol-Gel Method.
紀錄類型:
書目-語言資料,手稿 : Monograph/item
正題名/作者:
Fabrication of Tungsten Oxide Thin Film on Stainless Steel by Sol-Gel Method./
作者:
Momanyi, Geoffrey.
面頁冊數:
1 online resource (83 pages)
附註:
Source: Masters Abstracts International, Volume: 84-11.
Contained By:
Masters Abstracts International84-11.
標題:
Nanotechnology. -
電子資源:
click for full text (PQDT)
ISBN:
9798379521820
Fabrication of Tungsten Oxide Thin Film on Stainless Steel by Sol-Gel Method.
Momanyi, Geoffrey.
Fabrication of Tungsten Oxide Thin Film on Stainless Steel by Sol-Gel Method.
- 1 online resource (83 pages)
Source: Masters Abstracts International, Volume: 84-11.
Thesis (M.S.)--Youngstown State University, 2023.
Includes bibliographical references
Metal oxide semiconductor materials such as tungsten oxide are promising candidates for use as photoanodes in solar water splitting. Tungsten oxide is an n-type semiconductor that was prepared on stainless steel 304 substrate and subsequently studied for water-splitting applications. This study investigated the effect of the annealing temperature and substrate cleaning reagents on the photoelectrochemical (PEC) properties of tungsten oxide thin films. The main method of synthesis employed was the sol-gel method. Tungsten oxide thin films were deposited from a precursor solution of peroxotungstic acid by doctor blading. The as-deposited amorphous WO3 films were further subjected to heat treatment at various annealing temperatures (200 °C, 300 °C, 400 °C, and 500 °C) to transform the amorphous material into polycrystalline WO3 nanostructures. Surface morphology, the crystallinity of the film, the thickness of the film, and photoelectrochemical properties were investigated using scanning electron microscopy, (SEM), X-ray diffractometry (XRD), stylus profilometry, cyclic voltammetry (CV), and linear sweep voltammetry (LSV). The optimal WO3 film, at a thickness of 5 µm and annealed at 400 °C, achieved a photocurrent density of 98.0 µA/cm2 at an applied voltage of 0.53 V vs Ag/AgCl. It is essential to treat the substrate with HNO3 to passivate the surface of the stainless-steel substrate with the Cr2O3 layer.
Electronic reproduction.
Ann Arbor, Mich. :
ProQuest,
2024
Mode of access: World Wide Web
ISBN: 9798379521820Subjects--Topical Terms:
557660
Nanotechnology.
Subjects--Index Terms:
Tungsten oxideIndex Terms--Genre/Form:
554714
Electronic books.
Fabrication of Tungsten Oxide Thin Film on Stainless Steel by Sol-Gel Method.
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Metal oxide semiconductor materials such as tungsten oxide are promising candidates for use as photoanodes in solar water splitting. Tungsten oxide is an n-type semiconductor that was prepared on stainless steel 304 substrate and subsequently studied for water-splitting applications. This study investigated the effect of the annealing temperature and substrate cleaning reagents on the photoelectrochemical (PEC) properties of tungsten oxide thin films. The main method of synthesis employed was the sol-gel method. Tungsten oxide thin films were deposited from a precursor solution of peroxotungstic acid by doctor blading. The as-deposited amorphous WO3 films were further subjected to heat treatment at various annealing temperatures (200 °C, 300 °C, 400 °C, and 500 °C) to transform the amorphous material into polycrystalline WO3 nanostructures. Surface morphology, the crystallinity of the film, the thickness of the film, and photoelectrochemical properties were investigated using scanning electron microscopy, (SEM), X-ray diffractometry (XRD), stylus profilometry, cyclic voltammetry (CV), and linear sweep voltammetry (LSV). The optimal WO3 film, at a thickness of 5 µm and annealed at 400 °C, achieved a photocurrent density of 98.0 µA/cm2 at an applied voltage of 0.53 V vs Ag/AgCl. It is essential to treat the substrate with HNO3 to passivate the surface of the stainless-steel substrate with the Cr2O3 layer.
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