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Quality aspects in spatial data mining
Record Type:
Language materials, printed : Monograph/item
Title/Author:
Quality aspects in spatial data mining/ editors, Alfred Stein, John Shi, Wietske Bijker.
other author:
Bijker, Wietske,
Published:
Boca Raton, FL :Chapman & Hall/CRC, : 2008.,
Description:
1 online resource (374 p.)
Subject:
Spatial analysis (Statistics) -
Online resource:
https://www.taylorfrancis.com/books/9780429140570
ISBN:
9781420069273 (electronic bk.)
Quality aspects in spatial data mining
Quality aspects in spatial data mining
[electronic resource] /editors, Alfred Stein, John Shi, Wietske Bijker. - Boca Raton, FL :Chapman & Hall/CRC,2008. - 1 online resource (374 p.)
Includes bibliographical references and index.
Electronic reproduction.
[Boca Raton] :
CRC Press,
[200-?]
Mode of access: World Wide Web.
ISBN: 9781420069273 (electronic bk.)Subjects--Topical Terms:
562936
Spatial analysis (Statistics)
Index Terms--Genre/Form:
554714
Electronic books.
LC Class. No.: G70.212 / .Q35 2008
Dewey Class. No.: 910.285
Quality aspects in spatial data mining
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Quality aspects in spatial data mining
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[electronic resource] /
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editors, Alfred Stein, John Shi, Wietske Bijker.
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Boca Raton, FL :
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Chapman & Hall/CRC,
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2008.
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1 online resource (374 p.)
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Includes bibliographical references and index.
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Also available in print edition.
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CRC Press (http://www.crcpress.com).
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Electronic reproduction.
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[Boca Raton] :
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[200-?]
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Mode of access: World Wide Web.
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Description based on print version record.
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Spatial analysis (Statistics)
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Bijker, Wietske,
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Shi, John.
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Stein, Alfred.
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https://www.taylorfrancis.com/books/9780429140570
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