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Reliability of CMOS analog ICs

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Reliability of CMOS analog ICs/ by Hakan Kuntman ... [et al.].
other author:	Kuntman, Hakan.
Published:	Cham :Springer Nature Switzerland : : 2025.,
Description:	xii, 94 p. :ill. (some col.), digital ; : 24 cm.;
Contained By:	Springer Nature eBook
Subject:	Analog CMOS integrated circuits. -
Online resource:	https://doi.org/10.1007/978-3-031-85455-2
ISBN:	9783031854552

Reliability of CMOS analog ICs
Reliability of CMOS analog ICs[electronic resource] /by Hakan Kuntman ... [et al.]. - Cham :Springer Nature Switzerland :2025. - xii, 94 p. :ill. (some col.), digital ;24 cm. - Analog circuits and signal processing,2197-1854. - Analog circuits and signal processing..

Introduction -- The reliability model for PMOS and NMOS transistors based on statistical methods -- Demonstration of Proposed Method with Application Examples -- On the degradation of OTA-C-based CMOS low-power filter circuits for biomedical instrumentation -- Power MOSFET degradation and statistical investigation of the degradation effect on DC-DC converters and converter parameters.

This book presents recent advances in reliability investigation of MOS transistors and their applications. Theory and experimental results are discussed, in order to demonstrate the efficacy of the techniques presented. Readers will be enabled to improve their designs in application areas of analog signal processing, ranging from very low frequencies at several Hz levels of biomedical signals to RF applications operating at GHz level, from EEG signals to cognitive radio and encrypted communications or low-noise amplifiers in wireless communications. Presents recent advances in statistical method based reliability estimation of MOS transistors; Includes discussion of theory and experimental results, in order to demonstrate efficacy of techniques presented; Discusses design examples for specific application areas, enabling readers to follow recent advances and trends.

ISBN: 9783031854552

Standard No.: 10.1007/978-3-031-85455-2doiSubjects--Topical Terms:

1062812
Analog CMOS integrated circuits.

LC Class. No.: TK7871.99.M44

Dewey Class. No.: 621.395

Reliability of CMOS analog ICs
LDR:02349nam a2200349 a 4500 001 1159539
003 DE-He213
005 20250613131737.0
006 m d
007 cr nn 008maaau
008 251029s2025 sz s 0 eng d
020 $a 9783031854552 $q (electronic bk.)
020 $a 9783031854545 $q (paper)
024 7 $a 10.1007/978-3-031-85455-2 $2 doi
035 $a 978-3-031-85455-2
040 $a GP $c GP
041 0 $a eng
050 4 $a TK7871.99.M44
072 7 $a TJFC $2 bicssc
072 7 $a TEC008010 $2 bisacsh
072 7 $a TJFC $2 thema
082 0 4 $a 621.395 $2 23
090 $a TK7871.99.M44 $b R382 2025
245 0 0 $a Reliability of CMOS analog ICs $h [electronic resource] / $c by Hakan Kuntman ... [et al.].
260 $a Cham : $c 2025. $b Springer Nature Switzerland : $b Imprint: Springer,
300 $a xii, 94 p. : $b ill. (some col.), digital ; $c 24 cm.
338 $a online resource $b cr $2 rdacarrier
490 1 $a Analog circuits and signal processing, $x 2197-1854
505 0 $a Introduction -- The reliability model for PMOS and NMOS transistors based on statistical methods -- Demonstration of Proposed Method with Application Examples -- On the degradation of OTA-C-based CMOS low-power filter circuits for biomedical instrumentation -- Power MOSFET degradation and statistical investigation of the degradation effect on DC-DC converters and converter parameters.
520 $a This book presents recent advances in reliability investigation of MOS transistors and their applications. Theory and experimental results are discussed, in order to demonstrate the efficacy of the techniques presented. Readers will be enabled to improve their designs in application areas of analog signal processing, ranging from very low frequencies at several Hz levels of biomedical signals to RF applications operating at GHz level, from EEG signals to cognitive radio and encrypted communications or low-noise amplifiers in wireless communications. Presents recent advances in statistical method based reliability estimation of MOS transistors; Includes discussion of theory and experimental results, in order to demonstrate efficacy of techniques presented; Discusses design examples for specific application areas, enabling readers to follow recent advances and trends.
650 0 $a Analog CMOS integrated circuits. $3 1062812
650 1 4 $a Electronics Design and Verification. $3 1387809
650 2 4 $a Microwaves, RF Engineering and Optical Communications. $3 1365893
650 2 4 $a Wireless and Mobile Communication. $3 1207058
700 1 $a Kuntman, Hakan. $e author. $3 1387669
710 2 $a SpringerLink (Online service) $3 593884
773 0 $t Springer Nature eBook
830 0 $a Analog circuits and signal processing. $3 885481
856 4 0 $u https://doi.org/10.1007/978-3-031-85455-2
950 $a Engineering (SpringerNature-11647)