國立虎尾科技大學 |

Single-event effects, from space to accelerator environments = analysis, prediction and hardening by design /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Single-event effects, from space to accelerator environments/ by Ygor Quadros de Aguiar ... [et al.].
其他題名:	analysis, prediction and hardening by design /
其他作者:	Aguiar, Ygor Quadros de.
出版者:	Cham :Springer International Publishing : : 2025.,
面頁冊數:	x, 141 p. :ill. (some col.), digital ; : 24 cm.;
Contained By:	Springer Nature eBook
標題:	Aerospace Technology and Astronautics. -
電子資源:	https://doi.org/10.1007/978-3-031-71723-9
ISBN:	9783031717239

Single-event effects, from space to accelerator environments = analysis, prediction and hardening by design /
Single-event effects, from space to accelerator environmentsanalysis, prediction and hardening by design /[electronic resource] :by Ygor Quadros de Aguiar ... [et al.]. - Cham :Springer International Publishing :2025. - x, 141 p. :ill. (some col.), digital ;24 cm.

Radiation environments and their effects on electronics -- Introduction to Single-Event Effects -- Single-event effects prediction methodologies -- Radiation Hardness Assurance (RHA) methodologies -- Radiation hardening techniques -- Analysis of RHBD techniques at layout level -- Analysis of RHBD techniques at circuit level -- Hardness improvement based on signal probability -- Conclusions/Future Perspectives.

Open access.

This book describes the fundamental concepts underlying radiation-induced failure mechanisms in electronic components operating in harsh environments, such as in space missions or in particle accelerators. In addition to providing an extensive overview of the dynamics and composition of different radiation environments, the authors discuss the failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies. Additionally, novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels are described. Readers who are newcomers to this field will learn the fundamental concepts of particle interaction physics and electronics hardening design, starting from the composition and dynamics of radiation environments and their effects on electronics, to the qualification and hardening of components. Experienced readers will enjoy the comprehensive discussion of the state-of-the-art in modeling, simulation, and analysis of radiation effects developed in the recent years, especially the outcome of the recent European project, RADSAGA. Describes both the fundamental concepts underlying radiation effects in electronics and state-of-the-art hardening methodologies Addresses failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies Reveals novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels Offers readers the first book in which particle accelerator applications will be extensively included in the radiation effects context This is an open access book.

ISBN: 9783031717239

Standard No.: 10.1007/978-3-031-71723-9doiSubjects--Topical Terms:

683885
Aerospace Technology and Astronautics.

LC Class. No.: TK7870

Dewey Class. No.: 621.381

Single-event effects, from space to accelerator environments = analysis, prediction and hardening by design /
LDR:03124nam a2200337 a 4500 001 1160301
003 DE-He213
005 20241018125742.0
006 m d
007 cr nn 008maaau
008 251029s2025 sz s 0 eng d
020 $a 9783031717239 $q (electronic bk.)
020 $a 9783031717222 $q (paper)
024 7 $a 10.1007/978-3-031-71723-9 $2 doi
035 $a 978-3-031-71723-9
040 $a GP $c GP
041 0 $a eng
050 4 $a TK7870
072 7 $a TJFC $2 bicssc
072 7 $a TEC008010 $2 bisacsh
072 7 $a TJFC $2 thema
082 0 4 $a 621.381 $2 23
090 $a TK7870 $b .S617 2025
245 0 0 $a Single-event effects, from space to accelerator environments $h [electronic resource] : $b analysis, prediction and hardening by design / $c by Ygor Quadros de Aguiar ... [et al.].
260 $a Cham : $c 2025. $b Springer International Publishing : $b Imprint: Springer,
300 $a x, 141 p. : $b ill. (some col.), digital ; $c 24 cm.
505 0 $a Radiation environments and their effects on electronics -- Introduction to Single-Event Effects -- Single-event effects prediction methodologies -- Radiation Hardness Assurance (RHA) methodologies -- Radiation hardening techniques -- Analysis of RHBD techniques at layout level -- Analysis of RHBD techniques at circuit level -- Hardness improvement based on signal probability -- Conclusions/Future Perspectives.
506 $a Open access.
520 $a This book describes the fundamental concepts underlying radiation-induced failure mechanisms in electronic components operating in harsh environments, such as in space missions or in particle accelerators. In addition to providing an extensive overview of the dynamics and composition of different radiation environments, the authors discuss the failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies. Additionally, novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels are described. Readers who are newcomers to this field will learn the fundamental concepts of particle interaction physics and electronics hardening design, starting from the composition and dynamics of radiation environments and their effects on electronics, to the qualification and hardening of components. Experienced readers will enjoy the comprehensive discussion of the state-of-the-art in modeling, simulation, and analysis of radiation effects developed in the recent years, especially the outcome of the recent European project, RADSAGA. Describes both the fundamental concepts underlying radiation effects in electronics and state-of-the-art hardening methodologies Addresses failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies Reveals novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels Offers readers the first book in which particle accelerator applications will be extensively included in the radiation effects context This is an open access book.
650 2 4 $a Aerospace Technology and Astronautics. $3 683885
650 2 4 $a Electronics Design and Verification. $3 1387809
650 1 4 $a Electronic Circuits and Systems. $3 1366689
650 0 $a Particles (Nuclear physics) $3 579759
650 0 $a Electronic apparatus and appliances $x Effect of radiation on. $3 782041
700 1 $a Aguiar, Ygor Quadros de. $3 1487333
710 2 $a SpringerLink (Online service) $3 593884
773 0 $t Springer Nature eBook
856 4 0 $u https://doi.org/10.1007/978-3-031-71723-9
950 $a Engineering (SpringerNature-11647)