精密測量與機件檢驗
張笑航

 

  • 精密測量與機件檢驗
  • Record Type: Language materials, printed : monographic
    Secondary Intellectual Responsibility: 張笑航,
    Place of Publication: 臺北市
    Published: 全華; 全華;
    Year of Publication: 民76
    Edition: 初版
    Description: [12],447面圖,表 : 23公分;
    Series: 全華圖書
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  • 1 records • Pages 1 •
  • 1 records • Pages 1 •
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