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Beam effects, surface topography, an...

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Czanderna, Alvin Warren (1930)

Beam effects, surface topography, and depth profiling in surface analysis

Record Type:	Language materials, printed : monographic
Secondary Intellectual Responsibility:	CzandernaAlvin Warren, 1930
Secondary Intellectual Responsibility:	MadeyTheodore E,
Secondary Intellectual Responsibility:	PowellC. J,
Place of Publication:	New York
Published:	Plenum Press;
Year of Publication:	c1998
Description:	xix, 430 pill : 24 cm;
Series:	Methods of surface characerization
Subject:	Surfaces (Technology) - Analysis -
Subject:	Materials - Effect of radiation on -
ISBN:	0306458969

Beam effects, surface topography, and depth profiling in surface analysis
Beam effects, surface topography, and depth profiling in surface analysis / edited by Alvin W. Czanderna, Theodore E. Madey and Cedric J. Powell - New York : Plenum Press, c1998. - xix, 430 p ; ill ; 24 cm. - (Methods of surface characerization ; v. 5).
Includes bibliographical references and index.
ISBN 0306458969
Surfaces (Technology)Materials -- Analysis -- Effect of radiation on

Czanderna, Alvin Warren

Beam effects, surface topography, and depth profiling in surface analysis
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100 $a 20080130f 1998m y0engy01 b
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200 1 $a Beam effects, surface topography, and depth profiling in surface analysis $f edited by Alvin W. Czanderna, Theodore E. Madey and Cedric J. Powell
210 $a New York $c Plenum Press $d c1998
215 0 $a xix, 430 p $c ill $d 24 cm
225 2 $a Methods of surface characerization $v v. 5
320 $a Includes bibliographical references and index
410 0 $1 2001 $a ;v. 5 $a Methods of surface characerization
606 $a Surfaces (Technology) $x Analysis $3 416376 $2 lc $3 725634
606 $a Materials $x Effect of radiation on $3 434175 $2 lc $3 734252
676 $a 620/.44 $v 21
680 $a TA418.7 $b B43 1998
702 $a Czanderna $b Alvin Warren $f 1930 $3 424017
702 $a Madey $b Theodore E $3 447856
702 $a Powell $b C. J $3 447857
801 1 $a cw $b 國立虎尾科技大學圖書館圖書館 $c 20020626

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E022644

圖書館3F 書庫

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一般圖書

620.44 B366 1998

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1 records • Pages 1 •
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