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Semiconductor Memories : Technology,...

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IEEE Solid-State Circuits Council

Semiconductor Memories : Technology, Testing, and Reliability

紀錄類型:	書目-語言資料,印刷品 : 單行本
副題名:	Technology, Testing, and Reliability
作者:	SharmaAshok K,
合作者:	IEEE Solid-State Circuits Council
出版地:	New York
出版者:	IEEE, the Institute of Electrical and Electronics Engineers;
出版年:	c1997
面頁冊數:	xii, 462 pill : 26 cm;
標題:	Semiconductor storage devices -
附註:	"IEEE Solid-State Circuits Council, sponsor."
ISBN:	0780310004

Semiconductor Memories : Technology, Testing, and Reliability
Sharma, Ashok K

Semiconductor Memories : Technology, Testing, and Reliability / Ashok K. Sharma - New York : IEEE, the Institute of Electrical and Electronics Engineers, c1997. - xii, 462 p ; ill ; 26 cm.
"IEEE Solid-State Circuits Council, sponsor.".
Includes bibliographical references and index.
ISBN 0780310004
Semiconductor storage devices

Semiconductor Memories : Technology, Testing, and Reliability
LDR:00668cam 2200205 i 450 001 493308
005 20101024065519.0
009 a2003533030
010 1 $3 ,569 $a 0780310004 $b (hbk.) $d NT
100 $a 20080130f 1997m y0engy01 b
101 0 $a eng
200 1 $a Semiconductor Memories $e Technology, Testing, and Reliability $f Ashok K. Sharma
210 $a New York $c IEEE, the Institute of Electrical and Electronics Engineers $d c1997
215 0 $a xii, 462 p $c ill $d 26 cm
300 $a "IEEE Solid-State Circuits Council, sponsor."
320 $a Includes bibliographical references and index
606 $a Semiconductor storage devices $3 485063 $2 lc $3 726796
676 $a 621.39/732 $v 20
680 $a TK7895.M4 $b S49 1997b
700 $a Sharma $b Ashok K $3 485061
711 $a IEEE Solid-State Circuits Council $3 485062
801 0 $b DLC
801 0 $a cw $b BIB $c 20070124
801 1 $a cw $b 虎尾科技大學圖書館 $c 20070124

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