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Semiconductor Memories : Technology,...

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IEEE Solid-State Circuits Council

Semiconductor Memories : Technology, Testing, and Reliability

Record Type:	Language materials, printed : monographic
Title Information:	Technology, Testing, and Reliability
Author:	SharmaAshok K,
Alternative Intellectual Responsibility:	IEEE Solid-State Circuits Council
Place of Publication:	New York
Published:	IEEE, the Institute of Electrical and Electronics Engineers;
Year of Publication:	c1997
Description:	xii, 462 pill : 26 cm;
Subject:	Semiconductor storage devices -
Notes:	"IEEE Solid-State Circuits Council, sponsor."
ISBN:	0780310004

Semiconductor Memories : Technology, Testing, and Reliability
Sharma, Ashok K

Semiconductor Memories : Technology, Testing, and Reliability / Ashok K. Sharma - New York : IEEE, the Institute of Electrical and Electronics Engineers, c1997. - xii, 462 p ; ill ; 26 cm.
"IEEE Solid-State Circuits Council, sponsor.".
Includes bibliographical references and index.
ISBN 0780310004
Semiconductor storage devices

Semiconductor Memories : Technology, Testing, and Reliability
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200 1 $a Semiconductor Memories $e Technology, Testing, and Reliability $f Ashok K. Sharma
210 $a New York $c IEEE, the Institute of Electrical and Electronics Engineers $d c1997
215 0 $a xii, 462 p $c ill $d 26 cm
300 $a "IEEE Solid-State Circuits Council, sponsor."
320 $a Includes bibliographical references and index
606 $a Semiconductor storage devices $3 485063 $2 lc $3 726796
676 $a 621.39/732 $v 20
680 $a TK7895.M4 $b S49 1997b
700 $a Sharma $b Ashok K $3 485061
711 $a IEEE Solid-State Circuits Council $3 485062
801 0 $b DLC
801 0 $a cw $b BIB $c 20070124
801 1 $a cw $b 虎尾科技大學圖書館 $c 20070124

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