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Atomic force microscopy, scanning ne...

Kaupp, G.

Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces

紀錄類型:	書目-語言資料,印刷品 : 單行本
副題名:	application to rough and natural surfaces
作者:	KauppG.,
出版地:	Berlin
出版者:	Springer-Verlag;
出版年:	c2006
面頁冊數:	xii, 292 p.ill. : 24 cm.;
集叢名:	Nanoscience and technology
Subject:	Near-field microscopy -
Subject:	Atomic force microscopy -
ISBN:	9783540284055

Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces
Kaupp, G.

Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces / G. Kaupp - Berlin : Springer-Verlag, c2006. - xii, 292 p. ; ill. ; 24 cm.. - (Nanoscience and technology).
Includes bibliographical references and index.
ISBN 9783540284055ISBN 3540284052
Near-field microscopyAtomic force microscopy

Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces
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