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繞射式雙自由度光電水平儀之開發 = The Development of Two Degree of Freedom Diffraction Optoelectronic Level

Record Type:	Language materials, printed : monographic
Paralel Title:	The Development of Two Degree of Freedom Diffraction Optoelectronic Level
Author:	賴建名,
Secondary Intellectual Responsibility:	國立虎尾科技大學
Place of Publication:	[雲林縣]
Published:	撰者; 撰者;
Year of Publication:	民96[2007]
Description:	105面圖,表 : 30公分;
Subject:	位置感測器
Subject:	PSD
Online resource:	http://140.130.12.251/ETD-db/ETD-search-c/view_etd?URN=etd-0125107-094847
Summary:	一般電子式水平儀每次只能量測單方向的傾斜角度，因此該儀器量測平面的水平度時，會有兩種缺點：（1）必須量測互相垂直的兩個方向，方能評估待測平面在3D空間的傾斜角度；（2）因人為的誤差，該兩方向不一定互相垂直，且可能因量測位置移動，導致所量測的傾斜角度是近似垂直的兩條歪斜線傾斜角度，而非待測平面實際的傾斜角度。綜觀上述電子水平儀量測之缺點，本研究乃在開發一套可單次量測到二個方向自由度並可避免量測誤差的水平儀量測系統。本研究主要是利用單擺恆指向地心的原理，設計一種可單次量測到平面二個旋轉自由度誤差的光電式水平儀量測系統，以小型二極體雷射為光源入射至固定於單擺機構上的反射式光柵元件，因單擺在系統處於各種傾斜角度下恆指向地心特性，使其與系統上之各元件隨著傾斜角度而有相對位置變化，因此雷射光入射光柵角度改變，光柵會因入射角度差異而使得各階繞射光角度隨之改變，因而造成光路變化，讓投射至二維位置感測器上之光點發生位移，PSD再依感測到的光點位置不同，輸出相異的電壓值，最後藉由校正實驗，可求出系統傾斜角度與電壓輸出訊號之間的關係式，因此我們便可直接擷取PSD所輸出的電壓訊號帶入函數後，即可得到系統的傾斜角度。本文利用三角函數分析系統於各角度與PSD上光點位移量的關係，用以探討本儀器在線性模式的靈敏度。本研究並且實際建造該儀器，實驗結果顯示：本量測系統在A軸的量測解析度是0.06 arcsec，量測標準差約0.5 arcsec，量測範圍為±1900 arcsec，在B軸的量測解析度是0.057 arcsec，標準差約0.8 arcsec，量測範圍為±1800 arcsec。 Conventional levels can be employed to measure just one dimensional inclinations each time, and are frequently used to measure inclination, straightness and flatness. There are two disadvantages when such levels are used to measure two dimensional inclinations （such as flatness）: （1） two measurement steps are needed to measure two orthogonal directions in flatness; and （2） the two directions cannot be perfectly perpendicular to each other because of setting errors. This paper describes the development of a novel optoelectronic level which employs a simple pendulum, reflection grating, reflection mirror, 2D PSD and laser diode. In this system, a laser light is projected onto grating which is fixed on a simple pendulum, and grating reflects the diffraction light to reflection mirror which is fixed on a fixture, and reflection mirror reflects the light to the 2D PSD. Thus, the inclination measurement result can be obtained from the output of the PSD. This paper analyzed the relationship between inclination and displacement of ray on PSD by trigonometric function. This paper establishes a novel system and describes the complete experiment. The A-axis rotation angle from approximately -1900 to 1900 arcsec can be measured with an measuring standard deviation of 1.5 arcsec, and the B-axis rotation angle from approximately -1800 to 1800 arcsec can be measured with an measuring standard deviation of 0.5 arcsec.

繞射式雙自由度光電水平儀之開發 = The Development of Two Degree of Freedom Diffraction Optoelectronic Level
賴, 建名

繞射式雙自由度光電水平儀之開發 = The Development of Two Degree of Freedom Diffraction Optoelectronic Level / 賴建名撰 - [雲林縣] : 撰者, 民96[2007]. - 105面 ; 圖,表 ; 30公分.
參考書目：面.
位置感測器PSD

繞射式雙自由度光電水平儀之開發 = The Development of Two Degree of Freedom Diffraction Optoelectronic Level
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330 $a 一般電子式水平儀每次只能量測單方向的傾斜角度，因此該儀器量測平面的水平度時，會有兩種缺點：（1）必須量測互相垂直的兩個方向，方能評估待測平面在3D空間的傾斜角度；（2）因人為的誤差，該兩方向不一定互相垂直，且可能因量測位置移動，導致所量測的傾斜角度是近似垂直的兩條歪斜線傾斜角度，而非待測平面實際的傾斜角度。綜觀上述電子水平儀量測之缺點，本研究乃在開發一套可單次量測到二個方向自由度並可避免量測誤差的水平儀量測系統。本研究主要是利用單擺恆指向地心的原理，設計一種可單次量測到平面二個旋轉自由度誤差的光電式水平儀量測系統，以小型二極體雷射為光源入射至固定於單擺機構上的反射式光柵元件，因單擺在系統處於各種傾斜角度下恆指向地心特性，使其與系統上之各元件隨著傾斜角度而有相對位置變化，因此雷射光入射光柵角度改變，光柵會因入射角度差異而使得各階繞射光角度隨之改變，因而造成光路變化，讓投射至二維位置感測器上之光點發生位移，PSD再依感測到的光點位置不同，輸出相異的電壓值，最後藉由校正實驗，可求出系統傾斜角度與電壓輸出訊號之間的關係式，因此我們便可直接擷取PSD所輸出的電壓訊號帶入函數後，即可得到系統的傾斜角度。本文利用三角函數分析系統於各角度與PSD上光點位移量的關係，用以探討本儀器在線性模式的靈敏度。本研究並且實際建造該儀器，實驗結果顯示：本量測系統在A軸的量測解析度是0.06 arcsec，量測標準差約0.5 arcsec，量測範圍為±1900 arcsec，在B軸的量測解析度是0.057 arcsec，標準差約0.8 arcsec，量測範圍為±1800 arcsec。 Conventional levels can be employed to measure just one dimensional inclinations each time, and are frequently used to measure inclination, straightness and flatness. There are two disadvantages when such levels are used to measure two dimensional inclinations （such as flatness）: （1） two measurement steps are needed to measure two orthogonal directions in flatness; and （2） the two directions cannot be perfectly perpendicular to each other because of setting errors. This paper describes the development of a novel optoelectronic level which employs a simple pendulum, reflection grating, reflection mirror, 2D PSD and laser diode. In this system, a laser light is projected onto grating which is fixed on a simple pendulum, and grating reflects the diffraction light to reflection mirror which is fixed on a fixture, and reflection mirror reflects the light to the 2D PSD. Thus, the inclination measurement result can be obtained from the output of the PSD. This paper analyzed the relationship between inclination and displacement of ray on PSD by trigonometric function. This paper establishes a novel system and describes the complete experiment. The A-axis rotation angle from approximately -1900 to 1900 arcsec can be measured with an measuring standard deviation of 1.5 arcsec, and the B-axis rotation angle from approximately -1800 to 1800 arcsec can be measured with an measuring standard deviation of 0.5 arcsec.
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