建構雙光束雷射干涉儀校正精密機具之檢測系統 = Development ...
I-Ching Chen

 

  • 建構雙光束雷射干涉儀校正精密機具之檢測系統 = Development of a measurement system using dual-beam laser interferometer for precision machine tools
  • Record Type: Language materials, printed : monographic
    Paralel Title: Development of a measurement system using dual-beam laser interferometer for precision machine tools
    Author: 陳怡靜,
    Secondary Intellectual Responsibility: 覺文郁,
    Place of Publication: 雲林縣
    Published: 國立虎尾科技大學;
    Year of Publication: 民98[2009]
    Edition: 初版
    Description: 98面圖 : 30公分;
    Subject: 光學非接觸式檢測
    Subject: 垂直度誤差
    Subject: 精密機具校正
    Subject: 角度誤差
    Subject: 雙光束雷射干涉儀
    Subject: angular error
    Subject: calibration of precision machine tools
    Subject: dual-beam laser interferometer
    Subject: non–contact optical measurement
    Subject: squareness error
    Online resource: http://cetd.lib.nfu.edu.tw/etdservice/view_metadata?etdun=U0028-3007200922125600
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  • 2 records • Pages 1 •
 
T001302 圖書館B1F 博碩士論文專區 不流通(NON_CIR) 碩士論文(TM) TM 008.166M 7595 98 一般使用(Normal) On shelf 0
T001303 圖書館B1F 可外借論文區 不流通(NON_CIR) 一般圖書 008.166M 7595 98 一般使用(Normal) On shelf 0
  • 2 records • Pages 1 •
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