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Precision Landmark Location for Mach...
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Gutierrez, Jose A.
Precision Landmark Location for Machine Vision and Photogrammetry = Finding and Achieving the Maximum Possible Accuracy /
Record Type:
Language materials, printed : Monograph/item
Title/Author:
Precision Landmark Location for Machine Vision and Photogrammetry/ by Jose A. Gutierrez, Brian S.R. Armstrong.
Reminder of title:
Finding and Achieving the Maximum Possible Accuracy /
Author:
Gutierrez, Jose A.
other author:
Armstrong, Brian S.R.
Published:
London :Springer-Verlag, : 2008.,
Description:
xi, 162 p. :ill. (some), digital ; : 24 cm.;
Contained By:
Springer e-books
Subject:
Statistics for Engineering, Physics, Computer Science, Chemistry & Geosciences. -
Online resource:
http://dx.doi.org/10.1007/978-1-84628-913-2
ISBN:
9781846289132 (electronic bk.)
Precision Landmark Location for Machine Vision and Photogrammetry = Finding and Achieving the Maximum Possible Accuracy /
Gutierrez, Jose A.
Precision Landmark Location for Machine Vision and Photogrammetry
Finding and Achieving the Maximum Possible Accuracy /[electronic resource] :by Jose A. Gutierrez, Brian S.R. Armstrong. - London :Springer-Verlag,2008. - xi, 162 p. :ill. (some), digital ;24 cm.
ISBN: 9781846289132 (electronic bk.)Subjects--Topical Terms:
670208
Statistics for Engineering, Physics, Computer Science, Chemistry & Geosciences.
LC Class. No.: TA1634 / .G88 2008
Dewey Class. No.: 006.37
Precision Landmark Location for Machine Vision and Photogrammetry = Finding and Achieving the Maximum Possible Accuracy /
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Finding and Achieving the Maximum Possible Accuracy /
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by Jose A. Gutierrez, Brian S.R. Armstrong.
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Computer Science (Springer-11645; ZDB-2-SCS)
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