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Thin Film Materials : = Stress, Defect Formation and Surface Evolution.
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
正題名/作者:
Thin Film Materials :/
其他題名:
Stress, Defect Formation and Surface Evolution.
作者:
Freund, L. B.
其他作者:
Suresh, S.
出版者:
Cambridge :Cambridge University Press, : 2004.,
面頁冊數:
770 p.
標題:
Thin films. -
電子資源:
Click here to view book
ISBN:
9780511162121 (electronic bk.)
Thin Film Materials : = Stress, Defect Formation and Surface Evolution.
Freund, L. B.
Thin Film Materials :
Stress, Defect Formation and Surface Evolution.[electronic resource]. - Cambridge :Cambridge University Press,2004. - 770 p.
Cover; Half-title; Title; Copyright; Dedication; Contents; Preface; 1 Introduction and Overview; 2 Film stress and substrate curvature; 3 Stress in anisotropic and patterned films; 4 Delamination and fracture; Film buckling, bulging and peeling; 6 Dislocation formation in epitaxial systems; 7 Dislocation interactions and strain relaxation; 8 Equilibrium and stability of surfaces; 9 The role of stress in mass transport; References; Author index; Subject index
Thin films play an important role in many technological applications which include: microelectronic devices, magnetic storage media and surface coatings. Highly illustrated and containing numerous homework problems, this book will be essential reading on senior undergraduate and graduate courses on thin films.
Electronic reproduction.
Available via World Wide Web.
Mode of access: World Wide Web.
ISBN: 9780511162121 (electronic bk.)Subjects--Topical Terms:
560219
Thin films.
Index Terms--Genre/Form:
554714
Electronic books.
LC Class. No.: TA418.9.T45 F74 2003eb
Dewey Class. No.: 621.38152
Thin Film Materials : = Stress, Defect Formation and Surface Evolution.
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