以雷射光干涉檢測氧化鋁鈍化薄膜特性 = The thin film ch...
Tsai-Rung Shiu

 

  • 以雷射光干涉檢測氧化鋁鈍化薄膜特性 = The thin film characteristics of aluminum oxide passivation by laser beam interferometry
  • Record Type: Language materials, printed : monographic
    Paralel Title: The thin film characteristics of aluminum oxide passivation by laser beam interferometry
    Author: 許財榮,
    Secondary Intellectual Responsibility: 黃俊德,
    Place of Publication: 雲林縣
    Published: 國立虎尾科技大學;
    Year of Publication: 民99[2010]
    Edition: 初版
    Description: 82面圖 : 30公分;
    Subject: 雷射光
    Subject: 干涉
    Subject: 薄膜
    Subject: 腐蝕
    Subject: laser beam
    Subject: interference
    Subject: thin film
    Subject: corrosion
    Online resource: http://cetd.lib.nfu.edu.tw/etdservice/view_metadata?etdun=U0028-3007201012370300
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T002145 圖書館B1F 可外借論文區 不流通(NON_CIR) 一般圖書 008.154M 0869 99 一般使用(Normal) On shelf 0
T002144 圖書館B1F 博碩士論文專區 不流通(NON_CIR) 碩士論文(TM) TM 008.154M 0869 99 一般使用(Normal) On shelf 0
  • 2 records • Pages 1 •
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