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Semiconductor material and device ch...

Schroder, Dieter K.

Semiconductor material and device characterization

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Semiconductor material and device characterization/ Dieter K. Schroder.
作者:	Schroder, Dieter K.
出版者:	[Piscataway, NJ] :IEEE Press ; : c2006.,
面頁冊數:	1 online resource (xv, 779 p.) :ill. :
附註:	"Wiley-Interscience."
標題:	Semiconductors. -
電子資源:	http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237928
ISBN:	9780471749097

Semiconductor material and device characterization
Schroder, Dieter K.

Semiconductor material and device characterization[electronic resource] /Dieter K. Schroder. - 3rd ed. - [Piscataway, NJ] :IEEE Press ;c2006. - 1 online resource (xv, 779 p.) :ill.

"Wiley-Interscience."

Includes bibliographical references and index.

Resistivity -- Carrier and doping density -- Contact resistance and Schottky barriers -- Series resistance, channel length and width, and threshold voltage -- Defects -- Oxide and interface trapped charges, oxide thickness -- Carrier lifetimes -- Mobility -- Charge-based and probe characterization -- Optical characterization -- Chemical and physical characterization -- Reliability and failure analysis.

ISBN: 9780471749097

Standard No.: 10.1002/0471749095doiSubjects--Topical Terms:

578843
Semiconductors.
Index Terms--Genre/Form:

554714
Electronic books.

LC Class. No.: QC611 / .S335 2006

Dewey Class. No.: 621.3815/2

Semiconductor material and device characterization
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245 1 0 $a Semiconductor material and device characterization $h [electronic resource] / $c Dieter K. Schroder.
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300 $a 1 online resource (xv, 779 p.) : $b ill.
500 $a "Wiley-Interscience."
504 $a Includes bibliographical references and index.
505 0 $a Resistivity -- Carrier and doping density -- Contact resistance and Schottky barriers -- Series resistance, channel length and width, and threshold voltage -- Defects -- Oxide and interface trapped charges, oxide thickness -- Carrier lifetimes -- Mobility -- Charge-based and probe characterization -- Optical characterization -- Chemical and physical characterization -- Reliability and failure analysis.
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650 0 $a Semiconductors $x Testing. $3 771783
655 4 $a Electronic books. $2 local $3 554714
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