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Digital systems testing and testable...
~
Breuer, Melvin A.
Digital systems testing and testable design
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
正題名/作者:
Digital systems testing and testable design/ Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman.
作者:
Abramovici, Miron.
其他作者:
Breuer, Melvin A.
出版者:
New York, NY :Computer Science Press, : c1990.,
面頁冊數:
1 online resource (xxi, 653 p.) :ill. :
標題:
Digital integrated circuits - Testing. -
電子資源:
http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5266057
ISBN:
9780470544389
Digital systems testing and testable design
Abramovici, Miron.
Digital systems testing and testable design
[electronic resource] /Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman. - New York, NY :Computer Science Press,c1990. - 1 online resource (xxi, 653 p.) :ill. - Electrical engineering, communications, and signal processing. - Electrical engineering communications and signal processing series..
Includes bibliographical references (p. 644-645) and index.
ISBN: 9780470544389
Source: 9780470544389IEEEhttp://ieeexplore.ieee.orgSubjects--Topical Terms:
771952
Digital integrated circuits
--Testing.Index Terms--Genre/Form:
554714
Electronic books.
LC Class. No.: TK7874 / .A23 1990
Dewey Class. No.: 621.381/5
Digital systems testing and testable design
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