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Field guide to interferometric optic...
~
Society of Photo-optical Instrumentation Engineers.
Field guide to interferometric optical testing
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
正題名/作者:
Field guide to interferometric optical testing/ Eric P. Goodwin, James C. Wyant.
其他題名:
Interferometric optical testing.
作者:
Goodwin, Eric P.
其他作者:
Wyant, James C.
出版者:
Bellingham, Wash. (1000 20th St. Bellingham WA 98225-6705 USA) :SPIE, : 2006.,
面頁冊數:
1 online resource (xii, 100 p. : ill.) :digital file. :
附註:
"SPIE digital library."
標題:
Optical instruments - Testing. -
電子資源:
http://dx.doi.org/10.1117/3.702897
ISBN:
9780819478252 (electronic)
Field guide to interferometric optical testing
Goodwin, Eric P.
Field guide to interferometric optical testing
[electronic resource] /Interferometric optical testing.Eric P. Goodwin, James C. Wyant. - Bellingham, Wash. (1000 20th St. Bellingham WA 98225-6705 USA) :SPIE,2006. - 1 online resource (xii, 100 p. : ill.) :digital file. - SPIE field guides ;v. FG10. - SPIE field guides ;v. FG02.
"SPIE digital library."
Includes bibliographical references (p. 93-96) and index.
Glossary -- Fundamentals of interferometry -- Two-beam interference equation -- Basic concepts and definitions -- Conditions for obtaining fringes -- Visibility -- Spatial coherence -- Polarization -- Beamsplitters -- Plate and pellicle beamsplitters -- The interferometer -- Classic Fizeau interferograms -- Newton's rings -- Twyman-Green interferometer -- Compensating plate -- PBS-based Twyman-Green interferometer -- Laser-based Fizeau -- Mach-Zehnder interferometer -- Beam testing -- Lateral shear interferometry -- Rotating grating LSI -- Radial shear interferometer -- Interferograms -- Wavefront aberration coefficients -- Zernike polynomials -- RMS wavefront error -- Spherical aberration interferograms -- Astigmatism interferograms -- Interferograms-other aberrations -- Moir�e -- Moir�e and interferograms -- Phase-shifting interferometry -- Direct phase measurement -- Methods for phase shifting -- Continuous phase shifting -- Liquid crystal retarder -- Phase shifting algorithms -- Basic phase Unwrapping -- Phase-stepping vs. phase-ramping -- Errors in PSI -- Quantization errors -- Incorrect phase shift -- Avoiding vibrations -- Spatial synchronous and Fourier methods -- Spatial carrier interferometry -- Ground glass -- Surface microstructure -- Nomarski interference microscope -- Fringes of equal chromatic order (FECO) -- Phase-shifting interference microscope -- Multiple-wavelength interferometer.
Restricted to subscribers or individual electronic text purchasers.
A distillation of Dr. Wyant's course at the University of Arizona, this Field Guide covers the key fundamentals of interferometry, types of interferometers and interferograms, concepts of phase-shifting interferometry, long-wavelength interferometry, testing of aspheric surfaces, measurement of surface microstructure, flat and curved surface testing, and absolute measurements.
Mode of access: World Wide Web.
ISBN: 9780819478252 (electronic)
Standard No.: 10.1117/3.702897doiSubjects--Topical Terms:
797526
Optical instruments
--Testing.
LC Class. No.: TS514 / .G66 2006e
Dewey Class. No.: 535/.470287
Field guide to interferometric optical testing
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Glossary -- Fundamentals of interferometry -- Two-beam interference equation -- Basic concepts and definitions -- Conditions for obtaining fringes -- Visibility -- Spatial coherence -- Polarization -- Beamsplitters -- Plate and pellicle beamsplitters -- The interferometer -- Classic Fizeau interferograms -- Newton's rings -- Twyman-Green interferometer -- Compensating plate -- PBS-based Twyman-Green interferometer -- Laser-based Fizeau -- Mach-Zehnder interferometer -- Beam testing -- Lateral shear interferometry -- Rotating grating LSI -- Radial shear interferometer -- Interferograms -- Wavefront aberration coefficients -- Zernike polynomials -- RMS wavefront error -- Spherical aberration interferograms -- Astigmatism interferograms -- Interferograms-other aberrations -- Moir�e -- Moir�e and interferograms -- Phase-shifting interferometry -- Direct phase measurement -- Methods for phase shifting -- Continuous phase shifting -- Liquid crystal retarder -- Phase shifting algorithms -- Basic phase Unwrapping -- Phase-stepping vs. phase-ramping -- Errors in PSI -- Quantization errors -- Incorrect phase shift -- Avoiding vibrations -- Spatial synchronous and Fourier methods -- Spatial carrier interferometry -- Ground glass -- Surface microstructure -- Nomarski interference microscope -- Fringes of equal chromatic order (FECO) -- Phase-shifting interference microscope -- Multiple-wavelength interferometer.
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Vertical scanning techniques -- Flat surface testing -- Mirrors : continued -- Windows : continued -- Prisms -- Corner cubes -- Curved surface testing -- Testing curved surfaces-test plate -- Curved surfaces : Twyman-Green -- Curved surfaces : laser-based Fizeau -- Testing lenses or lens systems -- Shack cube interferometer -- Scatterplate interferometer -- Phase-shifting scatterplate interferometer -- Long-wavelength interferometry -- Smartt point diffraction interferometer -- Phase shifting a PDI -- Sommargren diffraction interferometer -- Curved surfaces, VSWLI -- Absolute measurements -- Absolute measurements : flats -- Absolute measurements : spheres -- Asphere testing -- Aspheric surfaces -- Aspheric testing -- Hyperboloid null tests -- Offner null -- Holographic null optics -- CGH basics -- CGH design guidelines -- Non-null tests -- Reverse raytracing -- Sub-Nyquist interferometry -- Long-wavelength interferometry -- Appendices -- Non-Interferometric testing -- Foucault (knife-edge) test -- Ronchi test -- Equation summary -- Bibliography -- Index.
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http://dx.doi.org/10.1117/3.702897
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