國立虎尾科技大學 |

Field guide to interferometric optical testing

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Field guide to interferometric optical testing/ Eric P. Goodwin, James C. Wyant.
remainder title:	Interferometric optical testing.
Author:	Goodwin, Eric P.
other author:	Wyant, James C.
Published:	Bellingham, Wash. (1000 20th St. Bellingham WA 98225-6705 USA) :SPIE, : 2006.,
Description:	1 online resource (xii, 100 p. : ill.) :digital file. :
Notes:	"SPIE digital library."
Subject:	Optical instruments - Testing. -
Online resource:	http://dx.doi.org/10.1117/3.702897
ISBN:	9780819478252 (electronic)

Field guide to interferometric optical testing
Goodwin, Eric P.

Field guide to interferometric optical testing[electronic resource] /Interferometric optical testing.Eric P. Goodwin, James C. Wyant. - Bellingham, Wash. (1000 20th St. Bellingham WA 98225-6705 USA) :SPIE,2006. - 1 online resource (xii, 100 p. : ill.) :digital file. - SPIE field guides ;v. FG10. - SPIE field guides ;v. FG02.

"SPIE digital library."

Includes bibliographical references (p. 93-96) and index.

Glossary -- Fundamentals of interferometry -- Two-beam interference equation -- Basic concepts and definitions -- Conditions for obtaining fringes -- Visibility -- Spatial coherence -- Polarization -- Beamsplitters -- Plate and pellicle beamsplitters -- The interferometer -- Classic Fizeau interferograms -- Newton's rings -- Twyman-Green interferometer -- Compensating plate -- PBS-based Twyman-Green interferometer -- Laser-based Fizeau -- Mach-Zehnder interferometer -- Beam testing -- Lateral shear interferometry -- Rotating grating LSI -- Radial shear interferometer -- Interferograms -- Wavefront aberration coefficients -- Zernike polynomials -- RMS wavefront error -- Spherical aberration interferograms -- Astigmatism interferograms -- Interferograms-other aberrations -- Moir�e -- Moir�e and interferograms -- Phase-shifting interferometry -- Direct phase measurement -- Methods for phase shifting -- Continuous phase shifting -- Liquid crystal retarder -- Phase shifting algorithms -- Basic phase Unwrapping -- Phase-stepping vs. phase-ramping -- Errors in PSI -- Quantization errors -- Incorrect phase shift -- Avoiding vibrations -- Spatial synchronous and Fourier methods -- Spatial carrier interferometry -- Ground glass -- Surface microstructure -- Nomarski interference microscope -- Fringes of equal chromatic order (FECO) -- Phase-shifting interference microscope -- Multiple-wavelength interferometer.

Restricted to subscribers or individual electronic text purchasers.

A distillation of Dr. Wyant's course at the University of Arizona, this Field Guide covers the key fundamentals of interferometry, types of interferometers and interferograms, concepts of phase-shifting interferometry, long-wavelength interferometry, testing of aspheric surfaces, measurement of surface microstructure, flat and curved surface testing, and absolute measurements.

Mode of access: World Wide Web.

ISBN: 9780819478252 (electronic)

Standard No.: 10.1117/3.702897doiSubjects--Topical Terms:

797526
Optical instruments
--Testing.

LC Class. No.: TS514 / .G66 2006e

Dewey Class. No.: 535/.470287

Field guide to interferometric optical testing
LDR:04253nam 2200385 a 4500 001 730974
003 SPIE
005 20090902113329.0
006 m e d
007 cr bn |||m|||a
008 130501s2006 waua fob 001 0 eng
020 $a 9780819478252 (electronic)
020 $z 0819465100 (print)
020 $z 9780819465108 (print)
024 7 $a 10.1117/3.702897 $2 doi
035 $a (OCoLC)435912034
035 $a (CaBNVSL)gtp00535500
035 $a 9780819478252
040 $a CaBNVSL $c CaBNVSL $d CaBNVSL
050 4 $a TS514 $b .G66 2006e
082 0 4 $a 535/.470287 $2 22
100 1 $a Goodwin, Eric P. $3 797524
245 1 0 $a Field guide to interferometric optical testing $h [electronic resource] / $c Eric P. Goodwin, James C. Wyant.
246 3 0 $a Interferometric optical testing.
260 $a Bellingham, Wash. (1000 20th St. Bellingham WA 98225-6705 USA) : $b SPIE, $c 2006.
300 $a 1 online resource (xii, 100 p. : ill.) : $b digital file.
490 1 $a SPIE field guides ; $v v. FG10
500 $a "SPIE digital library."
504 $a Includes bibliographical references (p. 93-96) and index.
505 0 $a Glossary -- Fundamentals of interferometry -- Two-beam interference equation -- Basic concepts and definitions -- Conditions for obtaining fringes -- Visibility -- Spatial coherence -- Polarization -- Beamsplitters -- Plate and pellicle beamsplitters -- The interferometer -- Classic Fizeau interferograms -- Newton's rings -- Twyman-Green interferometer -- Compensating plate -- PBS-based Twyman-Green interferometer -- Laser-based Fizeau -- Mach-Zehnder interferometer -- Beam testing -- Lateral shear interferometry -- Rotating grating LSI -- Radial shear interferometer -- Interferograms -- Wavefront aberration coefficients -- Zernike polynomials -- RMS wavefront error -- Spherical aberration interferograms -- Astigmatism interferograms -- Interferograms-other aberrations -- Moir�e -- Moir�e and interferograms -- Phase-shifting interferometry -- Direct phase measurement -- Methods for phase shifting -- Continuous phase shifting -- Liquid crystal retarder -- Phase shifting algorithms -- Basic phase Unwrapping -- Phase-stepping vs. phase-ramping -- Errors in PSI -- Quantization errors -- Incorrect phase shift -- Avoiding vibrations -- Spatial synchronous and Fourier methods -- Spatial carrier interferometry -- Ground glass -- Surface microstructure -- Nomarski interference microscope -- Fringes of equal chromatic order (FECO) -- Phase-shifting interference microscope -- Multiple-wavelength interferometer.
505 0 $a Vertical scanning techniques -- Flat surface testing -- Mirrors : continued -- Windows : continued -- Prisms -- Corner cubes -- Curved surface testing -- Testing curved surfaces-test plate -- Curved surfaces : Twyman-Green -- Curved surfaces : laser-based Fizeau -- Testing lenses or lens systems -- Shack cube interferometer -- Scatterplate interferometer -- Phase-shifting scatterplate interferometer -- Long-wavelength interferometry -- Smartt point diffraction interferometer -- Phase shifting a PDI -- Sommargren diffraction interferometer -- Curved surfaces, VSWLI -- Absolute measurements -- Absolute measurements : flats -- Absolute measurements : spheres -- Asphere testing -- Aspheric surfaces -- Aspheric testing -- Hyperboloid null tests -- Offner null -- Holographic null optics -- CGH basics -- CGH design guidelines -- Non-null tests -- Reverse raytracing -- Sub-Nyquist interferometry -- Long-wavelength interferometry -- Appendices -- Non-Interferometric testing -- Foucault (knife-edge) test -- Ronchi test -- Equation summary -- Bibliography -- Index.
506 $a Restricted to subscribers or individual electronic text purchasers.
520 $a A distillation of Dr. Wyant's course at the University of Arizona, this Field Guide covers the key fundamentals of interferometry, types of interferometers and interferograms, concepts of phase-shifting interferometry, long-wavelength interferometry, testing of aspheric surfaces, measurement of surface microstructure, flat and curved surface testing, and absolute measurements.
530 $a Also available in print version.
538 $a Mode of access: World Wide Web.
538 $a System requirements: Adobe Acrobat Reader.
650 0 $a Optical instruments $x Testing. $3 797526
650 0 $a Interferometry. $3 643415
700 1 $a Wyant, James C. $3 797525
710 2 $a Society of Photo-optical Instrumentation Engineers. $3 700253
830 0 $a SPIE field guides ; $v v. FG02 $3 797522
856 4 0 $u http://dx.doi.org/10.1117/3.702897