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Metrics for high-quality specular surfaces

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Metrics for high-quality specular surfaces/ Lionel R. Baker.
Author:	Baker, L. R.
Published:	Bellingham, Wash. (1000 20th St. Bellingham WA 98225-6705 USA) :SPIE, : c2004.,
Description:	1 online resource (xiv, 151 p. : ill.) :digital file. :
Notes:	"SPIE digital library."
Subject:	Surfaces (Technology) - Measurement. -
Online resource:	http://dx.doi.org/10.1117/3.582223
ISBN:	9780819478696 (electronic)

Metrics for high-quality specular surfaces
Baker, L. R.

Metrics for high-quality specular surfaces[electronic resource] /Lionel R. Baker. - Bellingham, Wash. (1000 20th St. Bellingham WA 98225-6705 USA) :SPIE,c2004. - 1 online resource (xiv, 151 p. : ill.) :digital file. - Tutorial texts in optical engineering ;v. TT65. - SPIE tutorial texts ;TT06..

"SPIE digital library."

Includes bibliographical references and index.

Preface -- List of Abbreviations-- List of Symbols --

Restricted to subscribers or individual electronic text purchasers.

This book supplies the optical component and systems designer, and quality assurance engineers and managers with the definitions, measurement principles, and standard metrics used to characterize high-quality specular surfaces. The author covers both the traditional visual methods as well as newer (but not necessarily better) computer-aided techniques and describes the metrics adopted by the new ISO standards, including the setting of form and finish tolerances. Key issues of industry are raised, to help stimulate research and development of new methods and standards that blend the best of the old and new approaches to surface assessment.

System requirements: Adobe Acrobat Reader.

ISBN: 9780819478696 (electronic)

Standard No.: 10.1117/3.582223doiSubjects--Topical Terms:

636699
Surfaces (Technology)
--Measurement.

LC Class. No.: TA418.7 / .B35 2004e

Dewey Class. No.: 681/.428

Metrics for high-quality specular surfaces
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100 1 $a Baker, L. R. $q (Lionel R.) $3 877270
245 1 0 $a Metrics for high-quality specular surfaces $h [electronic resource] / $c Lionel R. Baker.
260 $a Bellingham, Wash. (1000 20th St. Bellingham WA 98225-6705 USA) : $b SPIE, $c c2004.
300 $a 1 online resource (xiv, 151 p. : ill.) : $b digital file.
490 1 $a Tutorial texts in optical engineering ; $v v. TT65
500 $a "SPIE digital library."
504 $a Includes bibliographical references and index.
505 0 $a Preface -- List of Abbreviations-- List of Symbols --
505 0 $a Chapter 1 Surface Metrics, 1.1 Introduction ; 1.2 Why Measure Surfaces? 1.2.1 System function. 1.2.2 Appearance. 1.2.3 Manufacturing efficiency. 1.2.4 Benefits ; 1.3 Definition of Surface Metrics. 1.3.1 Surface metrics influencing quality. 1.3.2 Causes of defects in surface topography ; 1.4 Chapter Conclusions ; References --
505 0 $a Chapter 2 Surface Form, 2.1 Introduction ; 2.2 Optical Height Probes ; 2.3 Optical Slope Probe ; 2.4 Interferometers. 2.4.1 Twyman-Green interferometer. 2.4.2 Laser Fizeau interferometer. 2.4.3 Four-step measurement of phase. 2.4.4 Interlaboratory comparison of interferometers. 2.4.5 Interferometer error sources and calibration; 2.5 Form Tolerances. 2.5.1 Approximating a spherical surface. 2.5.2 Sagitta error. 2.5.3 Irregularity function. 2.5.4 Irregularity. 2.5.5 Approximating an aspheric surface. 2.5.6 Rotationally symmetric irregularity. 2.5.7 Total RMS deviation (RMSt). 2.5.8 RMS irregularity (RMSi). 2.5.9 RMS asymmetry (RMSa.) 2.5.10 Form indication on drawings ; 2.6 Chapter Conclusions ; References --
505 0 $a Chapter 3 Surface Roughness, 3.1 Introduction ; 3.2 Typical Optical Component Roughness Values ; 3.3 Deterministic Methods. 3.3.1 Stylus method. 3.3.2 Profilometry metrics. 3.3.3 Microinterferometer ; 3.4 Parametric Methods. 3.4.1 Surface point spread functions. 3.4.2 Total integrated scatter measurement ; 3.5 Surface Roughness Indications in Drawings ; 3.6 Chapter Conclusions ; References -- Chapter 4 SurfaceWaviness, 4.1 Introduction ; 4.2 Fourier Analysis of Height Profile ; 4.3 Spatial Frequency Zones ; 4.4 Computation of Texture ; 4.5 Chapter Conclusions ; References --
505 0 $a Chapter 5 Surface Imperfections, 5.1 Introduction ; 5.2 Imperfections and Subconscious Thoughts ; 5.3 Effect of Surface Imperfections ; 5.4 Impact of Imperfections on Market Access ; 5.5 Description of Imperfections. 5.5.1 Terminology. 5.5.2 Size of imperfections. 5.5.3 Substrates/materials. 5.5.4 Location. 5.5.5 Characteristics; 5.6 Influence of Imperfections on Quality. 5.6.1 Cosmetic influence. 5.6.2 Functional influence ; 5.7 Causes of Imperfections ; 5.8 Reduction of Damage ; 5.9 Imperfection Measurement. 5.9.1 Why measure imperfections? 5.9.2 Characterization and measurement of imperfections ; 5.10 Comparison of Measurement Methods ; 5.11 Imperfection Size Versus Visibility. 5.11.1 Surface step as an imperfection. 5.11.2 Step measurement by interferometry ; 5.12 The Eye as a Sensor. 5.12.1 Benefits. 5.12.2 Disbenefits ; 5.13 Disbenefits of Inspection ; 5.14 National Standards for Scratch Assessment. 5.14.1 United States. 5.14.2 Germany. 5.14.3 France. 5.14.4 United Kingdom ; 5.15 Level of Agreement Achieved Using National Standards ; 5.16 Scratch Reference Standards ; 5.17 Target Specification for Imperfection Measurement ; 5.18 Need for Standards ; 5.19 ISO TC 172 Optics and Optical Instruments ; 5.20 Comparison of Two Methods Proposed by ISO in 1996. 20.1 Method I. 5.20.2 Method II. 5.20.3 Comparison of Methods I and II ; 5.21 Chapter Conclusions ; References --
505 0 $a Chapter 6 Measurement of Imperfections by Obscuration, 6.1 Introduction ; 6.2 Optical Component Inspection ; 6.3 Radiometric Obscuration by Imperfections ; 6.4 Calibration Graticules ; 6.5 LEW and SED Measurement Requirements ; 6.6 LEW and SED Simple Viewing System ; 6.7 Analogue Microscope Image Comparator (AMIC). 6.7.1 Description. 6.7.2 Theory. 6.7.3 Method of operation ; 6.8 Digital Microscope Image Comparator (DMIC. 6.8.1 Description. 6.8.2 Results and discussion ; 6.9 Chapter Conclusions ; References --
505 0 $a Chapter 7 Surface Imperfection Quality Control, 7.1 Introduction ; 7.2 Survey of Tolerances. 7.2.1 British Standard BS4301 (1991). 7.2.2 American Standard MIL-O-13830A:1963. 7.2.3 German Standard DIN 3140: Part 7, 1978. 7.2.4 French Standard ; 7.3 Acceptable Thresholds for Scratches and Roughness ; 7.4 Inspection and Measurement Flow Diagram ; 7.5 Chapter Conclusions ; References --
505 0 $a Chapter 8 Far-Field Nanoscopy, 8.1 Introduction ; 8.2 Comparison between Subjective and Objective Measurements of Imperfections ; 8.3 Relative Contrast of Standard Scratches ; 8.4 Measurement of Imperfections and Contamination in Assemblies ; 8.5 Measurement of Imperfections in Coatings ; 8.6 Use of MIC to Measure Surface Texture ; 8.7 Use of MIC to Examine Phase Objects ; 8.8 Use of MIC in AC Mode ; 8.9 Use of MIC On-Machine ; 8.10 Chapter Conclusions ; References --
505 0 $a Chapter 9 Strip Product Inspection, 9.1 Introduction ; 9.2 Laser Beam Scanners ; 9.3 Camera Inspection Systems ; 9.4 Chapter Conclusions ; Acknowledgment ; References -- Appendix 1. Quality Metrics for Digital Cameras -- Appendix 2. Surface Cleaning -- Glossary -- Contacts and Further Reading -- Index.
506 $a Restricted to subscribers or individual electronic text purchasers.
520 $a This book supplies the optical component and systems designer, and quality assurance engineers and managers with the definitions, measurement principles, and standard metrics used to characterize high-quality specular surfaces. The author covers both the traditional visual methods as well as newer (but not necessarily better) computer-aided techniques and describes the metrics adopted by the new ISO standards, including the setting of form and finish tolerances. Key issues of industry are raised, to help stimulate research and development of new methods and standards that blend the best of the old and new approaches to surface assessment.
530 $a Also available in print version.
538 $a System requirements: Adobe Acrobat Reader.
538 $a Mode of access: World Wide Web.
588 $a Title from PDF t.p. (viewed on August 22, 2009).
650 0 $a Surfaces (Technology) $x Measurement. $3 636699
650 0 $a Optical measurements. $3 643414
650 0 $a Optical instruments $x Quality control. $3 877271
710 2 $a Society of Photo-optical Instrumentation Engineers. $3 700253
830 0 $a SPIE tutorial texts ; $v TT06. $3 877241
856 4 0 $u http://dx.doi.org/10.1117/3.582223